TP chip scanning method for improving point reporting accuracy
A scanning method and accuracy technology, which is applied in the field of TP chips, can solve the problems of uneven data collection and low accuracy of TP chip report points, and achieve increased report point accuracy, increased signal-to-noise ratio, and obvious signal-to-noise ratio Effect
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[0019] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0020] The invention discloses a TP chip scanning method for increasing the reporting accuracy, comprising the following steps:
[0021] The working method of the present invention is described in conjunction with accompanying drawings.
[0022] Such as Figure 4 As shown, 6 charge amplifiers are used, respectively labeled a...
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