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Method and device for training defect grading detection model, equipment and storage medium

A technology for detecting models and defects, applied in neural learning methods, biological neural network models, character and pattern recognition, etc., to overcome the high cost of manual labeling and solve the effect of grading information sources

Active Publication Date: 2021-08-03
重庆创通联达智能技术有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Current detection models cannot perform defect-level detection well

Method used

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  • Method and device for training defect grading detection model, equipment and storage medium
  • Method and device for training defect grading detection model, equipment and storage medium
  • Method and device for training defect grading detection model, equipment and storage medium

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Embodiment Construction

[0039] The features and exemplary embodiments of the various aspects of the present invention will be described in detail below, in order to make the objects, technical solutions and advantages of the present invention, the invention will be described in further detail below with reference to the accompanying drawings and specific embodiments. It will be appreciated that the specific embodiments described herein are intended to be in an explanation of the invention. For those skilled in the art, the present invention can be carried out without some details in these specific details. The description of the embodiments is merely a better understanding of the present invention is provided by way of example to illustrate the examples of the present invention.

[0040] It should be noted that in this article, a relationship term such as the first and second, etc. is only used to separate an entity or operation with another entity or an operational area, without having to require or imp...

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Abstract

The embodiment of the invention provides a method and device for training a defect grading detection model, equipment and a storage medium. The method comprises the following steps: acquiring a sample image; inputting the sample image into a preset defect grading detection model; performing defect grading detection on the sample image by using a classification branch network and a grading branch network in the defect grading detection model to obtain predicted values of the category, the position and the grade of the defect in the sample image; processing the sample image by using a clustering branch network in the defect grading detection model to obtain a false label of a defect level in the sample image, and taking the false label as a true value of the defect level in the sample image; and training a preset defect grading detection model according to the predicted values and truth values of the types, the positions and the levels of the defects to obtain a target defect grading detection model. According to the embodiment of the invention, the model capable of carrying out defect level detection can be obtained, and defect level labeling is not needed in the training process.

Description

Technical field [0001] The present invention belongs to the field of industrial surface defect detection, and more particularly to a method and apparatus, defect hierarchical detecting apparatus, and computing device and computer storage medium. Background technique [0002] With the development and application of neural network technology, the current industrial surface defect detection has begun to use the training detection model for defect positioning and classification, and has achieved good results. However, for industrial surface defect testing, people not only pay attention to the category and location of defects, but also pay attention to the level of defects. The current test model does not have a good test level of defect level. Inventive content [0003] The embodiment of the present invention provides a method and apparatus, a defect hierarchical detection method, a computing device, and a computer storage medium, and a model capable of performing defect level detec...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06N3/04G06N3/08G06K9/62
CPCG06N3/08G06N3/045G06F18/2414G06F18/23213Y02P90/30
Inventor 高航杜松
Owner 重庆创通联达智能技术有限公司
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