Method and device for training defect grading detection model, equipment and storage medium
A technology for detecting models and defects, applied in neural learning methods, biological neural network models, character and pattern recognition, etc., to overcome the high cost of manual labeling and solve the effect of grading information sources
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0039] The features and exemplary embodiments of the various aspects of the present invention will be described in detail below, in order to make the objects, technical solutions and advantages of the present invention, the invention will be described in further detail below with reference to the accompanying drawings and specific embodiments. It will be appreciated that the specific embodiments described herein are intended to be in an explanation of the invention. For those skilled in the art, the present invention can be carried out without some details in these specific details. The description of the embodiments is merely a better understanding of the present invention is provided by way of example to illustrate the examples of the present invention.
[0040] It should be noted that in this article, a relationship term such as the first and second, etc. is only used to separate an entity or operation with another entity or an operational area, without having to require or imp...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com