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System and method for controlling particles using projected light

A particle system, light control technology, applied in the field of drawings, particle control systems, can solve problems such as increasing the complexity and cost of the system

Pending Publication Date: 2021-08-17
WISCONSIN ALUMNI RES FOUND
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, such methods require several components (e.g., acousto-optic deflectors, spatial light modulators, diffractive, polarization-sensitive optics, etc.), which add significant system complexity and cost

Method used

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  • System and method for controlling particles using projected light
  • System and method for controlling particles using projected light
  • System and method for controlling particles using projected light

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Embodiment Construction

[0026] Conventional particle trapping techniques typically rely on interference between mutually coherent beams of light. These methods have several disadvantages, including susceptibility to beam misalignment, source phase drift, and phase noise. In contrast, the inventors found that projected light fields can be used to trap particles. As detailed in US Patent 9,355,750 (which is incorporated herein by reference in its entirety), projected light fields can be used to overcome the disadvantages of conventional techniques and provide several advantages. For example, particle traps created using projected light fields are scalable, allowing deeper well depths, and do not change position or depth in response to source phase drift or noise. Additionally, each capture point requires less energy, thus allowing more points at a given energy.

[0027] While recognizing practical considerations such as ease of implementation and cost, the present disclosure introduces a novel approa...

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Abstract

A system and method for controlling particles using projected light are provided. In some aspects, the method includes generating a beam of light using an optical source, and directing the beam of light to a beam filter comprising a first mask, a first lens, a second mask, and a second lens. The method also includes forming an optical pattern using the beam filter, and projecting the optical pattern on a plurality of particles to control their locations in space.

Description

[0001] A Note About Federally Funded Research [0002] This invention was made with Government support under W911NF-15-2-0061 awarded by Army / U.S. Army Research Laboratory (ARMY / ARL) and 1720220 awarded by the National Science Foundation. The government has certain rights in this invention. Background technique [0003] The field of the disclosure relates to systems and methods for controlling particles. More specifically, the present disclosure relates to systems and methods for trapping particles using projected light. [0004] The ability to confine and manipulate particles using optical techniques has paved the way for several scientific advances. For example, trapped particles have been used to create defect-free artificial crystals and are used to study various fundamental principles governing interactions and material properties. Neutral atoms have received special attention due to their well-defined quantum structure and charge neutrality. Charge neutrality isolate...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G21K1/00
CPCG21K1/006G06N10/00G04F5/14
Inventor M·萨夫曼
Owner WISCONSIN ALUMNI RES FOUND
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