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Object state detection method and device and electronic equipment

A detection method and object technology, which is applied in the field of data processing, can solve the problems of low calibration accuracy and detection object state accuracy, and achieve the effect of improving accuracy and high accuracy

Pending Publication Date: 2021-09-17
UBTECH ROBOTICS CORP LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Embodiments of the present application provide a detection method, device, and electronic equipment for the state of an object, aiming to solve the problem of low accuracy in the correction of existing errors, resulting in low accuracy in detecting the state of an object

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  • Object state detection method and device and electronic equipment
  • Object state detection method and device and electronic equipment
  • Object state detection method and device and electronic equipment

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Embodiment Construction

[0065] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.

[0066] It should be understood that when used in this specification and the appended claims, the term "comprising" indicates the presence of described features, integers, steps, operations, elements and / or components, but does not exclude one or more other Presence or addition of features, wholes, steps, operations, elements, components and / or collections thereof.

[0067] It should...

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Abstract

The invention is suitable for the technical field of data processing, and provides an object state detection method and device and electronic equipment, and the method comprises the steps: updating a correction value according to a first acceleration and a first angular velocity which are correspondingly collected at P continuous target moments before a Tth moment, wherein the P continuous target moments are P continuous moments which are closest to the Tth moment and the object is in a static state; correcting the second acceleration and the second angular velocity collected at the Tth moment according to the updated correction value; and detecting the physical state of the object at the Tth moment according to the corrected second acceleration and second angular velocity. According to the first acceleration and the first angular velocity which are correspondingly collected at P continuous moments which are closest to the Tth moment and the object is in a static state, a correction value is updated, and the second acceleration and the second angular velocity which are collected at the Tth moment are corrected, so that the accuracy of error correction can be improved, The object state is detected based on the corrected data, so that the object state detection accuracy is high.

Description

technical field [0001] The present application belongs to the technical field of data processing, and in particular relates to a detection method, device and electronic equipment of an object state. Background technique [0002] Modern MEMS inertial measurement sensors have realized acceleration and angular velocity detection and are used in various objects such as mobile phones, earphones and other consumer electronic devices. However, due to various reasons such as process and environment, especially low-cost inertial sensors (such as inertial measurement unit (IMU)), there are various measurement errors, such as zero bias, noise, cross-axis error, temperature drift, etc. [0003] At present, sensors applied to various objects usually set a reference error correction value for error correction when they leave the factory. Since the error may change with changes in the external environment, the correction accuracy of the sensor measurement error is low, making it accurate t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01C25/00
CPCG01C25/005
Inventor 黄祥斌
Owner UBTECH ROBOTICS CORP LTD