Mark position setting method and device
A technology for marking positions and setting methods, applied in design optimization/simulation, special data processing applications, geometric CAD, etc., can solve the problems of poor accuracy and high cost, and achieve the effect of reducing production costs and improving accuracy
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[0055] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, but not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the protection scope of the present application.
[0056] An embodiment of the present application provides a method and device for setting a mark position, the method for setting a mark position includes: acquiring a position parameter of a film forming area; determining a first candidate mark area on a preset substrate according to the position parameter of the film forming area ; Obtain occupant position parameters; determine a second candidate marker area in the first candidate marker area...
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