Thickness measuring device and thickness measuring method
A technology for measuring thickness and objects to be measured, applied in measuring devices, instruments, etc., can solve the problems of poor laser processing effect of objects, unfavorable equipment automation and intelligence, easy to forget and other problems
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[0022] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0023] Such as figure 1 , figure 2 and image 3 The thickness measuring device of one embodiment shown includes a stage 10 for placing an object to be measured (not shown in the figure), a measuring assembly 20 arranged above the object stage 10, and a measuring assembly 20 for driving the measuring assembly 20 along the vertical direction. A Z-axis power assembly 50 moving in a straight direction.
[0024] The Z-axis power assembly 50 is used to drive the meas...
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