An indirect test method for steady-state radiation temperature
A technology of radiation temperature and test method, applied in the field of infrared radiation temperature measurement, can solve the problem of inability to accurately deduce the radiation temperature of the radiation surface, and achieve the effect of clear principle, simple method and fast response speed.
Active Publication Date: 2022-07-08
BEIJING ZHENXING METROLOGY & TEST INST
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[0005] The invention provides an indirect test method for steady-state radiation temperature, which can solve the technical problem that the radiation temperature of the radiation surface cannot be accurately deduced from the results of single-point or multi-point contact temperature measurement in the prior art
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[0035] It should be noted that the embodiments in the present application and the features of the embodiments may be combined with each other in the case of no conflict. The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
[0036] It should be noted that the terminology used herein is for the purpose of describing specific e...
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The invention provides an indirect test method for steady-state radiation temperature, which includes monitoring the contact temperature T of the non-radiation part of the object to be tested c ; Monitor the ambient temperature T of the object to be tested a ;Monitor the radiation temperature T of the radiation surface of the object to be tested r ; build up the contact temperature T c , ambient temperature T a and radiation temperature T r The initial mathematical model between; obtain multiple sets of contact temperature measurements, ambient temperature measurements and radiation temperature measurements after steady-state at multiple test temperatures; based on the obtained multiple sets of contact temperature measurements, ambient temperature measurements and radiation The initial mathematical model is experimentally calibrated by the temperature measurement value to obtain the contact temperature T c , ambient temperature T a and radiation temperature T r The final mathematical model between the two; based on the contact temperature measurement value at any time, the ambient temperature measurement value and the final mathematical model, the calculated value of the radiation temperature at the corresponding time is obtained. The invention can solve the technical problem in the prior art that the radiation temperature of the radiation surface cannot be accurately deduced through the single-point or multi-point contact temperature measurement results.
Description
technical field [0001] The invention relates to the technical field of infrared radiation temperature measurement, in particular to an indirect test method for steady-state radiation temperature. Background technique [0002] Temperature is one of the most important parameters to determine the state of matter. Its measurement and control are very important in the fields of electrical equipment monitoring and diagnosis, metallurgy, thermal analysis of machine tools, agricultural biology, medical treatment, surface and other heat distribution, and the environment. effect. Temperature measurement can be divided into contact measurement and non-contact temperature measurement. Contact temperature measurement generally uses thermocouples and thermal resistance thermometers, which can reflect the real temperature at the contact point. . Non-contact temperature measurement generally refers to radiation temperature measurement, which can obtain the corresponding radiation tempera...
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IPC IPC(8): G01J5/52
CPCY02E30/30
Inventor 郭靖张鑫张玉国吴柯萱王加朋孙红胜
Owner BEIJING ZHENXING METROLOGY & TEST INST