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Method for testing output slope of temperature sensor at normal temperature

A temperature sensor and testing method technology, applied in thermometer testing/calibration, thermometers, instruments, etc., can solve the problems of increasing testing cost and testing time, achieve the effects of improving testing efficiency, avoiding high temperature heating, and reducing testing costs

Active Publication Date: 2021-10-01
SG MICRO
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The disadvantage of this method is that the temperature sensor chip needs to be heated to a high temperature, which greatly increases the test cost and test time

Method used

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  • Method for testing output slope of temperature sensor at normal temperature
  • Method for testing output slope of temperature sensor at normal temperature
  • Method for testing output slope of temperature sensor at normal temperature

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Embodiment Construction

[0015] Below with the accompanying drawings ( figure 1 ) and Examples illustrate the present invention.

[0016] figure 1 It is a schematic structural diagram of a temperature sensor circuit used to implement the method for testing the output slope of the temperature sensor at normal temperature in the present invention. refer to figure 1 , the temperature sensor output slope test method at normal temperature, utilize the bandgap reference generating circuit Bandgap and the arithmetic circuit in the temperature sensor chip circuit to be tested, set the voltage dividing resistor and the dual-mode test switch combination in the bandgap reference generating circuit Bandgap, Utilize the dual-mode test switch to strobe the divider resistor to change the positive temperature coefficient voltage value connected to the positive input terminal (+) of the operational amplifier OPA in the operational circuit, and different positive temperature coefficient voltage values ​​correspond to...

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Abstract

The invention relates to a method for testing an output slope of a temperature sensor at normal temperature. According to the method, a divider resistor and a dual-mode test switch combination are arranged in a band-gap reference generation circuit so as to change the positive temperature coefficient voltage connected with the positive input end of an operational amplifier, the two different output voltage values of the output voltage end of the temperature sensor can be tested under the same normal temperature condition, the output slope of the temperature sensor is determined through the two different output voltage values, high-temperature heating of a temperature sensor chip is avoided, and therefore the test cost can be reduced, and the test efficiency can be improved.

Description

technical field [0001] The invention relates to a temperature sensor output slope test technology, in particular to a temperature sensor output slope test method at normal temperature, by setting a voltage divider resistor and a dual-mode test switch combination in the bandgap reference generation circuit to change the positive input of the connected operational amplifier The positive temperature coefficient voltage at the terminal can test two different output voltage values ​​at the output voltage terminal of the temperature sensor under the same normal temperature conditions, and determine the output slope of the temperature sensor through these two different output voltage values, avoiding the high temperature of the temperature sensor chip Heating, which is beneficial to reduce the test cost and improve the test efficiency. Background technique [0002] The output slope value of the temperature sensor chip is an important indicator. The current method of obtaining its s...

Claims

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Application Information

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IPC IPC(8): G01K15/00
CPCG01K15/007
Inventor 白玮于翔谢程益
Owner SG MICRO
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