Chip aging dynamic reconfigurable testing device and use method thereof
A testing device and sophisticated technology, applied in measurement devices, cleaning methods using tools, electronic circuit testing, etc., can solve problems such as affecting the work efficiency of the staff, increasing the workload of the staff, and taking a certain amount of time.
Active Publication Date: 2021-10-08
苏州云极桓电子科技有限公司
View PDF6 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0003] When the existing test equipment is in use, the chips need to be installed inside the equipment one by one, but there is no place to place the chips on the outside of the equipment, so it can only be stored The chip box is placed on the ground or on the table on the side of the device. When the staff takes the chip for installation, they need to turn their heads or bend over to take the chip repeatedly. This process increases the workload of the staff and costs For a certain period of time, it affects the work efficiency of the staff
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0033] In order to more clearly understand the above objects, features and advantages of the present invention, the present invention will be further described below in conjunction with the accompanying drawings and embodiments. It should be noted that, in the case of no conflict, the embodiments of the present application and the features in the embodiments can be combined with each other.
[0034] In describing the present invention, it should be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", The orientation or positional relationship indicated by "horizontal", "top", "bottom", "inner", "outer", etc. are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than Nothing indicating or implying that a referenced device or element must have a particular orientation, be constructed, and ope...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention provides a chip aging dynamic reconfigurable testing device and a use method thereof, and relates to the technical field of chip detection. The chip aging dynamic reconfigurable testing device comprises an equipment body, wherein a tray device is arranged on the surface of the equipment body, a control panel is fixedly installed on one side of the equipment body, a wiping device is arranged on the outer side of the control panel, and a storage device is arranged on the other side of the equipment body. The use method of the chip aging dynamic reconfigurable testing device comprises S1 to S4, wherein the tray device comprises a rectangular plate, the outer side of the equipment body is rotatably connected with a rectangular plate, the outer side of the rectangular plate is provided with a structural groove, and the interior of the structural groove is slidably connected with a connecting block. According to the invention, through the arrangement of the tray device, a worker can conveniently place chips in the detection process, so that the time for the worker to bend down to take the chips is saved, the labor amount of the worker is reduced, and the working efficiency of the worker is improved.
Description
technical field [0001] The invention relates to the technical field of chip testing, in particular to a chip aging dynamic reconfigurable testing device and a use method thereof. Background technique [0002] With the development of modern technology, more and more chips are used in our daily life to provide convenience for people's life. In the process of chip production and processing, in order to ensure the qualified rate of chips, it is necessary The chip is subjected to aging test to test the service life of the chip, which requires the use of chip aging test equipment. [0003] When the existing test equipment is in use, the chips need to be installed inside the equipment one by one, but there is no place to place the chips on the outside of the equipment, so the box for storing the chips can only be placed on the ground or on the table on one side of the equipment. When the staff takes the chip for installation, they need to repeatedly turn their heads or bend down t...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More IPC IPC(8): G01R31/28B08B11/04B08B1/00
CPCG01R31/2862G01R31/2863G01R31/2867B08B11/04B08B1/143
Inventor 王华
Owner 苏州云极桓电子科技有限公司