A selection test device for research and development of semiconductor device materials
A technology for selecting test and device materials, applied in the direction of measuring devices, measuring device casings, components of electrical measuring instruments, etc., can solve the problems of elastic and anti-loosening of fixed bolts, easy loosening of fixed bolts, and inconvenient disassembly and assembly.
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[0045] as attached figure 1 to attach Figure 9 Shown:
[0046] The invention provides a selective testing device for the research and development of semiconductor device materials, which includes a main body plate 1; the main body plate 1 is fixed on a workbench, and a mounting seat 2 is installed on the main body plate 1, and a blank 5 is placed on the mounting seat 2; the main body An auxiliary part 3 is installed on the board 1, and a test part 4 is installed on the auxiliary part 3; the auxiliary part 3 includes: a seat body 301, which is fixedly connected to the main body plate 1 by bolts, and two symmetrical openings are arranged on the seat body 301. Bar sliding groove 302, and two sliding grooves 302 are T-shaped groove-shaped structures; Sliding block 303, sliding block 303 is rectangular block structure, and sliding block 303 contacts with blank 5, and two Protrusion 304; two protrusions 304 are slidingly connected with two sliding grooves 302, and the sliding blo...
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