Spring needle impedance detection machine and working method thereof

Abstract

The invention relates to a spring needle impedance detection machine and a working method thereof. The spring needle impedance detection machine comprises a rack, a detection machine head, a point inspection device and a waste removing device. A portal frame is arranged on a workbench of the rack, and suction nozzles of the detection machine head and the waste removing device are movably arranged on a cross beam of the portal frame. The point inspection device is fixed to the workbench and located below the portal frame, two linear driving mechanisms are symmetrically arranged on the workbench and located on the left side and the right side of the point inspection device, feeding tables are arranged on the linear driving mechanisms, and conductive trays loaded with spring needles are arranged on the feeding tables. The detection machine head moves between the two feeding tables and the point inspection device through a double-shaft moving mechanism arranged on the portal frame. The detection machine head is subjected to point inspection through the point inspection device, so that the detection precision of the detection device is ensured, and the point inspection efficiency is improved; the detection machine head can detect twenty spring needles in one round, the whole tray of spring needles on the conductive tray can be rapidly detected through multiple rounds of detection, and the detection efficiency is high.

Description

technical field [0001] The invention relates to the technical field of pogo pin production, in particular to a pogo pin impedance detector and a working method thereof. Background technique [0002] A pogo pin is a spring-type probe formed by three basic components: a needle shaft, a spring, and a needle tube. It is widely used in semiconductor equipment for electrical connection. Impedance testing is required after the pogo pins are assembled to ensure the consistency of the pogo pins. However, in the production process of the existing pogo pins, most of them adopt the method of random inspection, manually detect randomly selected pogo pins through the impedance detection machine, and detect a row of pogo pins at a time, and even some detection machines can only detect one at a time. The detection efficiency is very low, and the test efficiency needs to be improved. Contents of the invention [0003] In order to solve the deficiencies of the prior art, the invention pro...

AI Technical Summary

Problems solved by technology

However, in the production process of the existing pogo pins, most of them adopt the method of random inspection, manually detect randomly selected pogo pins through the impedance detection machine, and detect a row of pogo pins at a time, and even some detection machines can only detect one at a time. The detection efficiency is very low, and the test efficiency needs to be improved

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