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Screen defect measuring method and device and computer readable storage medium

A measurement method and computer program technology, applied in measurement devices, computer parts, calculations, etc., can solve problems such as inability to accurately measure screen defects

Pending Publication Date: 2021-11-12
深圳市鑫信腾科技股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Embodiments of the present application provide a method, device, and computer-readable storage medium for measuring screen defects, which can solve the problem that screen defects cannot be accurately measured

Method used

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  • Screen defect measuring method and device and computer readable storage medium
  • Screen defect measuring method and device and computer readable storage medium
  • Screen defect measuring method and device and computer readable storage medium

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Embodiment Construction

[0029] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.

[0030] First, before introducing the method and system provided by this application, some terms that will be mentioned below need to be explained. When the present application refers to the term "first" or "second" or other ordinal numerals, unless it really expresses the meaning of order according to the context, it should be understood that it is only used for distinction.

[0031...

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PUM

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Abstract

The invention provides a screen defect measuring method, which comprises the following steps: acquiring a to-be-processed image, the to-be-processed image comprising an original defect; enhancing the to-be-processed image to obtain an enhanced image; according to the enhanced image, determining and extracting a first defect, wherein the first defect is an enhanced original defect; determining a type corresponding to the first defect, wherein the type comprises at least one of a point defect and a line defect; for different types of first defects, measuring the sizes of the first defects by using different methods. According to the method provided by the invention, accurate measurement of the screen defect can be realized.

Description

technical field [0001] The present application belongs to the technical field of screen defect detection, and in particular relates to a method, device and computer-readable storage medium for measuring screen defects. Background technique [0002] The screen is an important part of the mobile terminal, and the quality of the screen is directly related to the normal use of the product. When there are defects on the screen, it will affect the optical characteristics of the product and seriously destroy the value of use. Phonology, it is very important to detect and measure the defects of the screen. [0003] The goal is that most of the inspections on the screen are only to detect the defects, but cannot reach the level of precise measurement required by the industry. Contents of the invention [0004] Embodiments of the present application provide a method, device, and computer-readable storage medium for measuring screen defects, which can solve the problem that screen ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/13G06T7/136G06T7/187G06T7/62G06T7/66G06T7/73G01N21/88G06K9/62
CPCG06T7/0004G06T7/13G06T7/73G06T7/136G06T7/62G06T7/187G06T7/66G01N21/8851G01N2021/8887G01N2021/8854G06T2207/10024G06T2207/30121G06F18/23213G06F18/24Y02P90/30
Inventor 郑国荣胡斌谢松乐胡一爽
Owner 深圳市鑫信腾科技股份有限公司