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Mass spectrometry device and mass spectrometry method

A mass analysis device and mass separation technology, which are applied in the methods of using particle spectrometers, particle separation tubes, and parts of particle separator tubes, etc., can solve problems such as consumption, reduce the number of repetitions and improve the accuracy.

Pending Publication Date: 2021-11-26
SHIMADZU SEISAKUSHO CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

For example, in LC-MS, since one measurement takes a certain amount of time, if comprehensive measurement is performed for device parameter adjustment, repeated measurement may be performed for a long time exceeding one day

Method used

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  • Mass spectrometry device and mass spectrometry method
  • Mass spectrometry device and mass spectrometry method
  • Mass spectrometry device and mass spectrometry method

Examples

Experimental program
Comparison scheme
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Embodiment Construction

[0040] LC-MS of one embodiment of the mass spectrometer of the present invention will be described with reference to the drawings.

[0041][Overall configuration of LC-MS in this embodiment]

[0042] figure 1 It is a schematic block diagram of the LC-MS of this embodiment.

[0043] exist figure 1 Among them, the measurement unit 1 includes a liquid chromatograph unit (LC unit) 2 and a mass spectrometer unit (MS unit) 3 . The mass analysis unit 3 includes an ion source 31 , a mass separation unit 32 and a detection unit 33 .

[0044] Although not shown, the liquid chromatograph unit 2 includes a liquid delivery pump, a syringe, a chromatography column, etc., injects a predetermined amount of sample into the mobile phase sent by the liquid delivery pump from the syringe, and makes the sample flow with the mobile phase. The flow is sent to the chromatographic column. Various components (compounds) in the sample are temporally separated while passing through the column, are e...

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PUM

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Abstract

A mass spectrometry device according to an embodiment of the present invention is provided with: an ionization unit (31); a mass separation unit (32); a detection unit (33); a first-measurement execution control unit (41) for controlling the ionization unit (31) and the like to repeatedly execute a first measurement on a target sample while changing the values of multiple parameters defined as device parameters; a second-measurement execution control unit (42) for controlling the ionization unit (31) and the like to execute a second measurement on the target sample with each parameter value of the device parameters being set to a predetermined reference value at two times or more from among before the start of the repetition of the first measurement, after the completion thereof, or during the repetition thereof; a correction processing unit (53) for correcting the results of the first measurement using the results of the second measurement executed at the two times or more; and a device parameter-related information acquisition unit (54, 55) for determining device parameters using the corrected measurement results, or acquiring reference information with which to determine the device parameters.

Description

technical field [0001] The present invention relates to a mass analysis device and a mass analysis method, and more specifically, to a mass analysis device and a mass analysis method having a function of adjusting device parameters to an optimal state or a state close thereto based on actual measurement results. Background technique [0002] Generally, in order to perform high-accuracy and high-sensitivity measurement using an analysis device, it is necessary to appropriately set device parameters that are analysis conditions in the analysis device. For example, when a compound in a sample solution eluted from a column of a liquid chromatograph is ionized in a liquid chromatograph mass spectrometer (LC-MS), a method based on electrospray ionization (ESI) and An ion source such as an atmospheric pressure chemical ionization (APCI) method, but in such an ion source, there are various parameters such as the temperature of each component, an applied voltage, and a gas flow rate ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/04
CPCH01J49/0027H01J49/0036H01J49/0468
Inventor 田川雄介石川勇树
Owner SHIMADZU SEISAKUSHO CO LTD