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High-precision evaluation method and circuit suitable for LDO (Low Dropout Regulator) dynamic load response

A dynamic load, high-precision technology, applied in circuit devices, battery load switching, battery circuit devices, etc., can solve the problems of difficult to meet test requirements, lack of practical test methods, etc., to achieve controllable test process, improve efficiency and reliability. sexual effect

Active Publication Date: 2021-12-03
WUXI ETEK MICROELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, for the dynamic load response of LDO, there is a lack of test methods with strong practicability, high reliability and good testability, and it is difficult to meet the test requirements in production.

Method used

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  • High-precision evaluation method and circuit suitable for LDO (Low Dropout Regulator) dynamic load response
  • High-precision evaluation method and circuit suitable for LDO (Low Dropout Regulator) dynamic load response
  • High-precision evaluation method and circuit suitable for LDO (Low Dropout Regulator) dynamic load response

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Embodiment Construction

[0033] The present invention will be further described below in conjunction with specific drawings and embodiments.

[0034] In order to effectively realize the dynamic load response test of the LDO and improve the efficiency and controllability of the test, the present invention includes an LDO circuit 1 to be tested and a test load circuit adapted to be connected to the output end of the LDO circuit 1 to be tested. Including a load dynamic switching control circuit 8 adapted to connect with the test load circuit, through the load dynamic switching control circuit 8, the load state loaded to the output terminal of the LDO circuit 1 to be tested through the test load circuit can be in a light load state and a heavy load state During the cycle switching process, until the dynamic load response of the LDO circuit 1 to be tested is obtained.

[0035]Specifically, the to-be-tested LDO circuit 1 may adopt an existing common LDO circuit form, which is well known to those skilled in ...

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Abstract

The invention relates to a test method and circuit, in particular to a high-precision evaluation method and circuit suitable for LDO (Low Dropout Regulator) dynamic load response. According to the technical scheme provided by the invention, the test method for the LDO dynamic load response test comprises a to-be-tested LDO circuit and a test load circuit adaptively connected with the output end of the to-be-tested LDO circuit, and further comprises a load dynamic switching control circuit adaptively connected with the test load circuit. Through the load dynamic switching control circuit, the load state loaded to the output end of the to-be-tested LDO circuit through the test load circuit can be in the cyclic switching process of the light load state and the heavy load state until the dynamic load response of the to-be-tested LDO circuit is measured. According to the invention, the dynamic load response test of the LDO can be effectively realized, the test process is controllable, and the test efficiency and reliability are improved.

Description

technical field [0001] The invention relates to a test method and circuit, in particular to a high-precision evaluation method and circuit suitable for LDO dynamic load response. Background technique [0002] LDO (Linear Voltage Regulator) is a power management circuit with a large application scale in the market at present, and one of its core parameters is a dynamic load response. The dynamic load response of LDO generally needs to be obtained through testing. At present, for the dynamic load response of LDO, there is a lack of test methods with strong practicability, high reliability and good testability, and it is difficult to meet the test requirements in production. Contents of the invention [0003] The purpose of the present invention is to overcome the deficiencies in the prior art, and provide a high-precision evaluation method and circuit suitable for LDO dynamic load response, which can effectively realize the dynamic load response test of LDO, the test proces...

Claims

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Application Information

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IPC IPC(8): G01R31/00H02J7/00
CPCG01R31/00H02J7/0068H02J7/0029
Inventor 汪芳吴鹤松石波史良俊
Owner WUXI ETEK MICROELECTRONICS