Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Semiconductor device and forming method thereof

A semiconductor and device technology, applied in the field of semiconductor devices and their formation, can solve problems such as lost data

Pending Publication Date: 2021-12-07
TAIWAN SEMICON MFG CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Non-volatile memory retains its stored data when power is removed while volatile memory loses its stored data when power is removed

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor device and forming method thereof
  • Semiconductor device and forming method thereof
  • Semiconductor device and forming method thereof

Examples

Experimental program
Comparison scheme
Effect test

example 1

[0077] Example 1. A semiconductor device, comprising: a first transistor arranged on a substrate; a second transistor arranged on the first transistor, wherein the second transistor includes: a channel layer; a gate A dielectric layer surrounds sidewalls of the channel layer; and a gate electrode surrounds sidewalls of the gate dielectric layer; and a memory element is disposed over the second transistor.

example 2

[0078] Example 2. The semiconductor device of example 1, wherein the channel layer has a columnar shape.

example 3

[0079] Example 3. The semiconductor device of Example 1, wherein the channel layer has a ring shape in plan view.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
diameteraaaaaaaaaa
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention relates to a semiconductor device and a method of forming the same. A device includes a first transistor over a substrate, a second transistor disposed over the first transistor, and a memory element disposed over the second transistor. The second transistor includes a channel layer, a gate dielectric layer surrounding a sidewall of the channel layer, and a gate electrode surrounding a sidewall of the gate dielectric layer.

Description

technical field [0001] The present disclosure relates to semiconductor devices and methods of forming the same. Background technique [0002] Many modern electronic devices contain electronic memory. Electronic memory can be either volatile memory or nonvolatile memory. Non-volatile memory retains its stored data when power is removed, while volatile memory loses its stored data when power is removed. Emerging memories such as resistive random-access memory (RRAM), magnetoresistive random-access memory (MRAM), and phase-change random-access memory (PCRAM) are due to their simple structures and their compatibility with complementary metal-oxide-semiconductor (CMOS) CMOS) logic fabrication process compatibility makes it a promising candidate for next-generation non-volatile memories. Contents of the invention [0003] According to a first aspect of the present disclosure, there is provided a semiconductor device, including: a first transistor arranged on a substrate; a se...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L27/22H01L27/24H10B69/00
CPCH10B63/30H10B61/22H01L29/66666H01L29/78642H01L29/42392H01L29/7869H10B63/34H10B63/84H10B63/80H01L25/0657H10B61/20
Inventor 王晨晨吕俊颉徐志安林佑明杨世海
Owner TAIWAN SEMICON MFG CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products