Devm test platform and test method for wi-fi6 chip

A test platform and test method technology, applied in receiver monitoring, transmitter monitoring and other directions, can solve problems such as low test efficiency, difficult to guarantee accuracy, and inability to meet Wi-Fi testing, so as to improve test efficiency and accuracy and reduce production. The effect of testing costs

Active Publication Date: 2022-02-11
LANSUS TECH INC
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The traditional power transmitter test platform can only perform static tests, that is, the power supply, enable signal and RF input signal are always on, while for Wi-Fi, the signal is sent and received in a FEM (RF front-end module) Yes, so it is a dynamic test, and the traditional test platform cannot meet the DEVM (Dynamic Error Vector Magnitude) test of Wi-Fi 6 chips
In addition, the traditional test platform requires manual control, the test efficiency is low, and the accuracy is difficult to guarantee

Method used

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  • Devm test platform and test method for wi-fi6 chip
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  • Devm test platform and test method for wi-fi6 chip

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Embodiment Construction

[0036] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0037] The specific implementations / examples described here are specific specific implementations of the present invention, and are used to illustrate the concept of the present invention. limit. In addition to the embodiments described here, those skilled in the art can also adopt other obvious technical solutions based on the claims of the application and the contents disclosed in the description, and these technical solutions include adopting any obvious changes made to the embodiments described here. The replacement and modified technical solutions are all within the protection scope of the present invention.

[0038] The following descriptions of the various embodiments refer to the accompanying drawings to illustrate specific embodiments in which the present invention can be practiced. The directional terms mentioned in the present inv...

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Abstract

The present invention provides a DEVM test platform for a Wi-Fi6 chip, wherein the function signal generator provides a trigger signal for a vector signal generator, a spectrum analyzer and a power meter respectively, and also provides an enabling signal for the chip to be tested; the vector signal generator The device is used to provide pulse modulation signals for the chip under test; the power supply is used to supply power to the chip under test; the input end of the directional coupler is used to connect the chip under test, the coupling end is connected to the power meter, and the through end is connected to the input end of the spectrum analyzer; The computer separately controls the function signal generator, vector signal generator, spectrum analyzer, power meter and power supply to realize the DEVM performance test of the chip to be tested. The present invention also provides a DEVM testing method of the Wi-Fi6 chip. Compared with related technologies, the test platform and test method of the present invention have high efficiency and precision and low cost.

Description

technical field [0001] The invention relates to the technical field of a performance test platform of power devices, in particular to a DEVM test platform and a test method using a Wi-Fi6 chip. Background technique [0002] Wi-Fi 6 (IEEE 802.11.ax) is the sixth-generation wireless network technology, the name of the Wi-Fi standard, and a wireless local area network technology created by the Wi-Fi Alliance based on the IEEE 802.11 standard. Wi-Fi 6 will allow communication with up to eight devices at speeds up to 9.6Gbps. The Wi-Fi standard uses DEVM to describe the modulation accuracy of the transmitted signal. [0003] Error Vector Magnitude (Error Vector Magnitude, EVM) is the vector difference between the actual transmitted signal and the ideal error-free reference signal at a given moment, and can fully measure the amplitude error and phase error of the modulated signal. It is usually defined as the ratio of the root mean square value of the average power of the error ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04B17/15H04B17/29
CPCH04B17/15H04B17/29
Inventor 刘鹏郭嘉帅
Owner LANSUS TECH INC
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