Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Additive manufacturing structured light loopback detection method and device, electronic equipment and storage medium

A technology of additive manufacturing and structured light, which is applied in the direction of measuring devices, optical devices, image data processing, etc., can solve the problems of consuming a lot of time and computing resources, registration residuals, and negative impacts on measurement efficiency, and achieves improved targeted performance, good industrial value, and the effect of reducing the amount of calculation and data

Pending Publication Date: 2022-01-04
河南垂天智能制造有限公司 +1
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

These redundant information will consume a lot of time and computing resources, and have a significant negative impact on measurement efficiency;
[0007] 2. Lack of complete 3D point cloud models of high-quality complex additive manufacturing parts
Although the registration error between two point clouds is small enough in continuous registration, from a global perspective, the resulting complete model may still have registration residuals, which do not meet the requirements of high precision and rationality, resulting in the failure of 3D quality detection. The accuracy is affected, and the test results are not convincing;

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Additive manufacturing structured light loopback detection method and device, electronic equipment and storage medium
  • Additive manufacturing structured light loopback detection method and device, electronic equipment and storage medium
  • Additive manufacturing structured light loopback detection method and device, electronic equipment and storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0090] The embodiments of the present disclosure propose a method, device, electronic device, and storage medium for additively manufactured structured light loopback detection, which are further described in detail below with reference to the accompanying drawings and specific embodiments.

[0091] The embodiment of the first aspect of the present disclosure proposes a method for detecting a loopback of an additive manufacturing structure light. The overall process is as follows figure 1 shown, including the following steps:

[0092] (1) Use the additively manufactured substrate as the target to be tested;

[0093] (2) Using a structured light measurement system to obtain a sequence of structured light encoded fringe images mapped on the surface of the measured target. The structured light measurement system described in the embodiments of the present disclosure adopts a conventional system; preferably, in some embodiments of the present disclosure, phase shift coding is use...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an additive manufacturing structured light loopback detection method and device, electronic equipment and a storage medium, and belongs to the field of additive manufacturing detection. The method comprises the steps that a structured light measurement system is used for obtaining a substrate point cloud and all frame point clouds of the surface of an object subjected to additive manufacturing in the additive manufacturing process to form a point cloud frame sequence; key frame point clouds are extracted from the point cloud frame sequence to form a key frame sequence; and plane loopback optimization registration is carried out on the key frame sequence, and the registered key frame sequence forms a point cloud model of the object for additive manufacturing. The method and device have good performance in the aspects of actual measurement, point cloud registration, model generation and the like, meet the requirements of efficient and high-precision complete point cloud model generation, and have good industrial value.

Description

technical field [0001] The present disclosure belongs to the field of additive manufacturing inspection, and in particular relates to a method, device, electronic device and storage medium for additively fabricated structured light loopback inspection. Background technique [0002] Additive manufacturing (AM), or 3D printing, is a new generation of industrial manufacturing technology that obtains processing data from three-dimensional (3D) information, and forms workpieces by stacking layers of manufacturing materials. Since the additively manufactured parts are obtained from the accumulation of materials, the quality of the surface of the material accumulation cannot be highly guaranteed during actual production and processing. At the same time, it is affected by hardware equipment, production methods, etc., resulting in the three-dimensional information of the additively manufactured parts on the surface. There may be some errors. Therefore, the three-dimensional inspecti...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01B11/25G06T17/00
CPCG01B11/25G06T17/00
Inventor 朱明甫徐静唐自衡马传琦侯青霞
Owner 河南垂天智能制造有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products