Switch durability automatic testing and monitoring system based on MCU control

Abstract

The invention provides a switch durability automatic testing and monitoring system based on MCU control. The switch durability automatic testing and monitoring system is characterized by comprising a control unit, a man-machine interaction unit, a data acquisition unit and a driving unit, wherein the control unit is electrically connected with the man-machine interaction unit, the data acquisition unit and the driving unit respectively; the man-machine interaction unit is used for receiving an external instruction and sending the external instruction to the control unit, and is also used for receiving and displaying the on-off state information fed back by the control unit; the data acquisition unit is used for acquiring switch contact voltage and feeding back the switch contact voltage to the control unit; the control unit is used for generating and outputting a driving instruction to the driving unit according to an external instruction, and is also used for judging the contact on-off state of the switch according to an external instruction and the acquired switch contact voltage; and the driving unit drives the execution unit according to the driving instruction. The purpose of automatic testing is achieved.

Description

technical field [0001] The invention belongs to the technical field of switch durability test benches, and in particular relates to a switch durability automatic test and monitoring system based on MCU control. Background technique [0002] The existing technical scheme of the switch durability test bench adopts a computer control cabinet with a high and low temperature test box and a built-in operation table and electronic load box, resulting in a large overall equipment volume of the test monitoring system. And because the equipment as a whole is composed of multiple parts, and the direct physical connection of each part is very fixed, it is inconvenient to move the equipment, and it is not convenient for the specific operation on the test site. At the same time, due to the limitations of the acquisition equipment in the prior art, in the test of switch durability automation, only the contact pressure drop is collected for the state signal collection of the switch contacts...

AI Technical Summary

Problems solved by technology

[0002] The existing technical scheme of the switch durability test bench adopts a computer control cabinet with a high and low temperature test box and a built-in operating table and electronic load box, resulting in a large overall equipment for the test and monitoring system.

And because the equipment as a whole is composed of multiple parts, and the direct physical connection of each part is very fixed, it is inconvenient to move the equipment, and it is not convenient for the specific operation on the test site

At the same time, due to the limitations of the acquisition equipment in the prior art, in the test of switch durability automation, only the contact pressure drop is collected for the state signal collection of the switch contacts, which leads to the limitation of the overall monitoring effect and cannot be effectively Determine the state of the switch

Furthermore, because the existing technology only collects the contact pressure drop of the switch contacts, it is impossible to obtain the status information of the switch from other levels, resulting in deviations in the accuracy of the test results

Furthermore, the prior art is not equipped with any display device, and the test operator cannot obtain the status information of the switch in time, resulting in a lag in the acquisition of test results

All in all, the existing computer control cabinet is bulky and inconvenient to move, so high and low temperature boxes cannot be arbitrarily selected according to resources, and only the contact voltage drop can be collected, and the voltage collected by the switch cannot be displayed in real time, and it cannot be judged whether the contact is connected. Abnormal, unable to realize switch automation test

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