Burn-in test equipment
A test equipment and burn-in technology, applied in the direction of environment/reliability test, measuring electricity, measuring device, etc., can solve the problems of low burn-in production capacity, large oven site area, etc., achieve low processing cost, fast installation and maintenance, The effect of simple overall structure design
Pending Publication Date: 2022-01-25
SHANGHAI FUDAN MICROELECTRONICS GROUP
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Problems solved by technology
On the one hand, due to the limitation of the internal space of the oven, the number of aging devices that can be accommodated in a single batch of aging test process is small; on the other hand, the oven occupies a large area, and the aging capacity per unit area is low
Method used
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Embodiment Construction
[0051] The existing aging test equipment is basically designed based on a closed high-temperature oven. The existing temperature-controlled fixtures for aging are only used in high-temperature oven-type aging testing equipment. On the one hand, due to the limitation of the internal space of the oven, the number of aging devices that can be accommodated in a single batch of aging test is small. On the other hand, the oven occupies a large area, and the aging capacity per unit area is low.
[0052] Different from the prior art, in the technical solution provided by the embodiment of the present invention, the burn-in test equipment includes: a bracket with multiple layers of first platforms; each layer of first platforms detachably arranged in the multi-layer first platforms The chassis is supported by a bracket; at least one burn-in slot module is arranged in the chassis; wherein, each burn-in slot module in at least one burn-in slot module includes at least one temperature zon...
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The embodiment of the invention provides burn-in test equipment. The burn-in test equipment comprises: a bracket with a plurality of layers of first platforms; a case which is detachably arranged on each layer of first platform in the plurality of layers of first platforms, wherein the case is supported by the bracket; at least one burn-in slot is arranged in the case, wherein each burn-in slot in the at least one burn-in slot comprises at least one temperature zone sub-module, and each temperature zone sub-module in the at least one temperature zone sub-module is used for carrying out a burn-in test on the device to be tested. Compared with the prior art, the burn-in test equipment provided by the embodiment of the invention has the open shelf structure, the burn-in load plate is inserted into the burn-in slot of each layer of the shelf structure to realize burn-in of the to-be-tested devices, and the number of the to-be-tested devices is not limited by the volume of a traditional oven; and the number of devices to be tested and the utilization rate of a site in a single-batch burn-in test are greatly improved.
Description
technical field [0001] The invention relates to the technical field of burn-in testing, in particular to burn-in testing equipment. Background technique [0002] The existing aging test equipment is basically designed based on a closed high-temperature oven. The existing temperature-controlled fixtures for aging are only used in high-temperature oven-type aging testing equipment. On the one hand, due to the limitation of the internal space of the oven, the number of aging devices that can be accommodated in a single batch of aging test is small. On the other hand, the oven occupies a large area, and the aging capacity per unit area is low. Contents of the invention [0003] An embodiment of the present invention provides a burn-in testing device, comprising: a bracket with a multi-layer first platform; a chassis detachably arranged on each layer of the first platform in the multi-layer first platform, the chassis is supported by the bracket; At least one burn-in slot mod...
Claims
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Login to View More IPC IPC(8): G01R31/00G01R1/04
CPCG01R31/003G01R1/0408
Inventor 王延政周培周军詹超石彬彬宫鹏鹏季培成
Owner SHANGHAI FUDAN MICROELECTRONICS GROUP