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Novel test fixture and test method suitable for microwave assembly

A technology of microwave components and test fixtures, which is applied in the field of measurement and testing, can solve problems such as poor reliability and slow microwave component testing, and achieve the effect of improving test efficiency

Active Publication Date: 2022-01-28
BEIJING RES INST OF TELEMETRY +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The present invention aims to solve the problem of slow microwave component testing and poor reliability, and provides a new test fixture and test method suitable for microwave components. By using the combined fixture to quickly position the microwave component, the test of the microwave component can be completed quickly. While greatly improving the test efficiency of microwave components, it can also avoid damage to product interfaces caused by repeated plugging and unplugging, and greatly improve the test efficiency and product reliability of microwave components

Method used

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  • Novel test fixture and test method suitable for microwave assembly
  • Novel test fixture and test method suitable for microwave assembly
  • Novel test fixture and test method suitable for microwave assembly

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0064] Such as Figure 1-3 As shown, a new type of test fixture suitable for microwave components, including a test base 1 and a detachable left fixed frame 2 assembled on the test base 1, a right fixed frame 3, a type A combination fixture 4, and a B type combination Fixture 5, the fastening positions of the left side fixing frame 2 and the right side fixing frame 3 on the test base 1 are adjustable;

[0065] The test base 1, the left fixing frame 2, the right fixing frame 3, the A-type combination fixture 4 and the B-type combination fixture 5 are used to fix the microwave component, the test base 1 is located at the bottom of the microwave component, the left side fixing frame 2, the right side The fixed frame 3, the A-type combined fixture 4 and the B-type combined fixture 5 are located around the microwave assembly;

[0066] Such as Figure 4 As shown, the A-type combination fixture 4 includes a detachable A-type combination fixture frame 41 assembled on the upper ends ...

Embodiment 2

[0078] Such as Figure 7-8 As shown, a new test method suitable for microwave components includes the following steps:

[0079] S1, install the left fixed frame 2 and the right fixed frame 3 on the test base 1, install the B-type combined fixture 5 on the lower end of the left fixed frame 2 and the right fixed frame 3, put the microwave assembly, and place The radio frequency adapter 421 on the B-type combined fixture 5 is assembled with the radio frequency port of the microwave component, and then the A-type combined fixture 4 is fixed on the upper ends of the left fixed frame 2 and the right fixed frame 3;

[0080] S11. Assembling the test base: install the left fixed frame 2 and the right fixed frame 3 on the test base 1, adjust the positions of the left fixed frame 2 and the right fixed frame 3 so that the microwave components can be put in;

[0081] The left fixing frame 2, the right fixing frame 3 and the test base 1 are fixed in multiple positions so as to adjust the dis...

Embodiment 3

[0092] A novel test method applicable to microwave components, comprising the following steps:

[0093] (1) Install the radio frequency test cable assembly 42 on the A-type composite fixture frame 41 and fasten it with screws; install the video test cable assembly 43 on the A-type composite fixture frame 41 and fasten it with screws.

[0094] (2) Install all the radio frequency test cable assemblies 42 on the B-type combination fixture frame 51 and fasten them with screws.

[0095] (3) Connect the test cable assemblies on the A-type combination fixture 4 and the B-type combination fixture 5 with corresponding test equipment.

[0096] (4) Install the left fixed frame 2 and the right fixed frame 3 on the test base 1, adjust the positions of the left fixed frame 2 and the right fixed frame 3, and ensure that the left fixed frame 2 and the right fixed frame 3 are in line with the There are gaps between microwave components.

[0097] (5) Fix the B-type combination fixture 5 on th...

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Abstract

The invention provides a novel test fixture suitable for a microwave assembly and a test method. The novel test fixture comprises a test base, a left side fixing frame, a right side fixing frame, an A-type combined fixture and a B-type combined fixture, wherein the left side fixing frame, the right side fixing frame, the A-type combined fixture and the B-type combined fixture are detachably assembled on the test base; the fastening positions of the left side fixing frame and the right side fixing frame on the test base are adjustable; one end of the A-type combined clamp and one end of the B-type combined clamp are connected with a port of the microwave assembly, the other end of the A-type combined clamp and the other end of the B-type combined clamp are connected with a port of testing equipment, and the A-type combined clamp and the B-type combined clamp are detached after being completely tested along with the microwave assembly. According to the invention, the microwave assembly is rapidly positioned by using the combined clamp, and the test of the microwave assembly can be rapidly completed, so that the test efficiency of the microwave assembly is greatly improved, the damage of repeated plugging to a product interface can be avoided, and the test efficiency of the microwave assembly and the product reliability are greatly improved.

Description

technical field [0001] The invention relates to the technical field of measurement and testing, in particular to a novel testing fixture and testing method suitable for microwave components. Background technique [0002] With the rapid progress of microwave and millimeter wave technology, microwave and millimeter wave products are constantly developing towards miniaturization and integration. In order to meet the requirements of miniaturization and high integration of microwave components, the interface of microwave components has changed from traditional SMA type connectors to SMP Even with the transformation of miniature connectors such as WMP, the existing testing technology can no longer meet the needs of rapid testing of highly integrated microwave components, and the slowness of testing seriously restricts the progress of product delivery. Contents of the invention [0003] The present invention aims to solve the problem of slow microwave component testing and poor r...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/04
CPCG01R1/04Y02E10/50
Inventor 唐统帅刘德喜史磊刘亚威杨红艳
Owner BEIJING RES INST OF TELEMETRY
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