FPGA-based multi-parameter measuring system of water flow standard device

Abstract

The invention discloses an FPGA-based multi-parameter measuring system of a water flow standard device. The multi-parameter measuring system comprises an ultrasonic flow measuring device, a dynamic pressure detecting device, a temperature detecting device, a humidity detecting device and a pipeline vibration detecting device; the ultrasonic flow measuring device is used for detecting flow parameters of a pipeline in the water flow standard device; the dynamic pressure detecting device is used for detecting fluctuation of water flow pressure parameters of the pipeline in the water flow standard device; the temperature detecting device is used for detecting the water flow temperature in the pipeline in the water flow standard device and indoor environment temperature parameters; the humidity detecting device is used for detecting the humidity parameter of the indoor environment where the water flow standard device is located; and the pipeline vibration detecting device is used for detecting vibration parameters generated during operation of the pipeline in the water flow standard device.

Description

technical field [0001] The invention relates to the technical field of measurement of a multi-parameter system of a water flow standard device, in particular to a multi-parameter measurement system of an FPGA-based water flow standard device. Background technique [0002] The parameter measurement of the water flow standard device mainly involves the measurement and statistical analysis of flow information, pressure information, temperature information, humidity information, vibration information and other data. At present, the acquisition of the above measurement information is obtained through a single detection device, and then the data is processed manually. The more cumbersome process is to collect and process multiple data separately. During the acquisition process Relatively time-consuming and labor-intensive. It can be seen that a single measurement system can no longer satisfy the large amount of data collection and statistics in the current big data time zone. C...

AI Technical Summary

Problems solved by technology

At present, the acquisition of the above measurement information is obtained through a single detection device, and then the data is processed manually. The more cumbersome process is to collect and process multiple data separately. During the acquisition process Time-consuming and labor-intensive

It can be seen that a single measurement system can no longer satisfy the large amount of data collection and statistics in the current big data time zone.

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