Secondary amplification circuit, comparison circuit, readout circuit, and image sensor circuit
An image sensor and two-stage amplification technology, applied in the field of image processing, can solve the problems of ADC comparator output data deviation, final ADC conversion data change, ADC comparator output flip offset, etc., to achieve the effect of reducing the impact
Active Publication Date: 2022-02-08
CHENGDU LIGHT COLLECTOR TECH
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Problems solved by technology
[0002] In the traditional CMOS image sensor (CMOS image sensor, CIS) structure, the leakage of the second-stage reset transistor of the column-level ADC comparator will cause the output of the ADC comparator to flip and shift, and the final ADC conversion data will change.
[0003] Due to the inconsistency of the processing technology of the second-level reset transistor of each column of the ADC comparator, the slight deviation of its size and threshold voltage will cause deviations in the leakage current, which will lead to deviations in the output data of the ADC comparators in different columns, resulting in image visually visible dark streaks
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[0037] In order to make the purpose, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings of the present invention. Obviously, the described embodiments are part of the present invention Examples, not all examples. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention. Unless otherwise defined, the technical terms or scientific terms used herein shall have the usual meanings understood by those skilled in the art to which the present invention belongs. As used herein, "comprising" and similar words mean that the elements or items appearing before the word include the elements or items listed after the word and their equivalents, without excluding other el...
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The invention provides a secondary amplification circuit which comprises a secondary amplification unit and an electric leakage compensation unit, the secondary amplification unit comprises a first PMOS tube, a first NMOS tube, a second NMOS tube and a first capacitor, and the electric leakage compensation unit is connected with the first capacitor and used for sharing charges with the first capacitor. Therefore, the charge lost by the leakage current of the first capacitor can be compensated, and the influence of the leakage current on the circuit can be effectively reduced. The invention also provides a comparison circuit, a reading circuit and an image sensor circuit.
Description
technical field [0001] The invention relates to the technical field of image processing, in particular to a secondary amplifier circuit, a comparison circuit, a readout circuit and an image sensor circuit. Background technique [0002] In a traditional CMOS image sensor (CMOS image sensor, CIS) structure, the leakage of the second-stage reset transistor of the column-level ADC comparator will cause the output inversion of the ADC comparator to shift and cause the final ADC conversion data to change. [0003] Due to the inconsistency of the processing technology of the second-level reset transistor of each column of the ADC comparator, the slight deviation of its size and threshold voltage will cause deviations in the leakage current, which will lead to deviations in the output data of the ADC comparators in different columns, resulting in image Visually visible dark streaks are formed. [0004] Therefore, it is necessary to provide a novel secondary amplifier circuit, compa...
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IPC IPC(8): H04N5/374H04N5/378
CPCH04N25/76H04N25/75
Inventor 蔡化陈正高菊陈飞芮松鹏夏天
Owner CHENGDU LIGHT COLLECTOR TECH