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Integrated circuit and test operation method thereof

A technology of integrated circuits and test operations, applied in the direction of electronic circuit testing, measuring electricity, measuring devices, etc.

Pending Publication Date: 2022-03-01
SK HYNIX INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The drive circuit can perform preset test operations based on the final test control value

Method used

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  • Integrated circuit and test operation method thereof
  • Integrated circuit and test operation method thereof
  • Integrated circuit and test operation method thereof

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Embodiment Construction

[0021] The description of the present disclosure is merely one embodiment for structural and / or functional description. The scope of rights of the present disclosure should not be construed as being limited to the embodiments described in the specification. That is, since the embodiments can be modified in various ways and can have various forms, the scope of rights of the present disclosure should be understood to include equivalents that can realize the technical spirit. Furthermore, the objects or effects proposed in the present disclosure do not mean that a specific embodiment should include all of the objects or effects or include only these effects. Therefore, the scope of rights of the present disclosure should not be construed as being limited thereby.

[0022] The meanings of the terms described in this application should be understood as follows.

[0023] Terms such as 'first' and 'second' are used to distinguish one element from another, and the scope of the prese...

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Abstract

The invention relates to an integrated circuit and a test operation method thereof. An integrated circuit includes a test count circuit, a test information storage circuit, a sequence control circuit, and a driver circuit. The test count circuit generates a count address signal. The test information storage circuit stores a test control value and outputs the test control value based on the count address signal. The sequence control circuit changes an output sequence of the test control values based on the sequence control signal, and outputs a final test control value based on the test control value or the target control value. The driving circuit performs a preset test operation based on the final test control value.

Description

technical field [0001] Various embodiments generally relate to an integrated circuit and a test operation method thereof, and more particularly, to an integrated circuit for providing various test sequences and a test operation method of the integrated circuit. Background technique [0002] Generally, various tests are performed on integrated circuits such as semiconductor devices and semiconductor memory devices before they are put on the market. Traditionally, automatic test equipment (Automatic Test Equipment, ATE) is used for testing operations on integrated circuits. Automatic test equipment is a single product developed to determine whether an integrated circuit is well designed. Since the cost of automatic test equipment is relatively high, the cost of an integrated circuit is based on whether the integrated circuit is tested by automatic test equipment. The cost of the integrated circuit is higher as it takes longer to test the integrated circuit with automatic tes...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2851G11C29/20G11C2029/4402G11C29/18G11C29/021G11C29/028G01R31/318597G11C2029/1806
Inventor 郑升炫
Owner SK HYNIX INC