Coding method of test vector

Abstract

The invention discloses a test vector coding method, which relates to the technical field of testing, and comprises the following steps of: dividing a test file into a plurality of sub-files; performing column coding on excitation codes of P rows of test vectors in the sub-file to obtain M excitation data frames, performing row coding on function codes of the P rows of test vectors to obtain P function data frames, and obtaining a coding result of the sub-file, each excitation data frame corresponds to one test channel and comprises coding results of excitation codes corresponding to the test channels in all P rows of test vectors in the subfile, and each function data frame comprises coding results of function codes in the corresponding row of test vectors; according to the method, the test vector storage depth can be well improved, especially under the condition that the number of actually-used test channels is small, the compression efficiency can be greatly improved, and more test vector files can be stored in the limited storage space of a test machine.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a method for encoding test vectors. Background technique [0002] With the rapid development of integrated circuit (IC) technology, the integration of digital circuits has been continuously improved, and a number of highly integrated integrated circuits such as FPGAs and CPUs have emerged. When testing such integrated circuits, especially In the functional test of finished product test (FT test), the test complexity increases rapidly, and the test vector is often very large. [0003] In order for the testing machine to meet the batch tests of the functional tests of these integrated circuits, it is necessary for the testing machine to be able to store enough test vectors and to store all the test vectors required for the functional testing of single-chip circuits. The requirements for the internal storage space of the testing machine higher. If the testing machine cannot meet t...

AI Technical Summary

Problems solved by technology

If the testing machine cannot meet the test vector depth required for single-chip circuit function testing, it needs to be loaded in multiple times. Since loading test vectors takes up the main time of the entire test process, the test efficiency will be greatly reduced.

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