Chip testing device, chip testing system and data acquisition method

A chip testing and chip technology, applied in the field of testing, can solve problems such as low efficiency

Pending Publication Date: 2022-04-12
RADROCK (SHENZHEN) TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Embodiments of the present invention provide a chip testing device, a chip testing system, and a data collection method to solve the problem of low efficiency when collecting chip state switching time

Method used

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  • Chip testing device, chip testing system and data acquisition method
  • Chip testing device, chip testing system and data acquisition method
  • Chip testing device, chip testing system and data acquisition method

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Embodiment Construction

[0034] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0035]It should be understood that the invention can be embodied in different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. In the drawings, the size and relative sizes of layers and regions may be exaggerated for clarity, and like reference numera...

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PUM

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Abstract

The invention discloses a chip testing device. The chip testing device comprises a network analyzer and a trigger module, wherein the network analyzer, the trigger module and a chip to be tested are electrically connected; the network analyzer is configured to send a trigger instruction to the trigger module and collect the state switching time of the to-be-tested chip; the trigger module is configured to respond to the trigger instruction and send a first trigger signal to the to-be-tested chip, and the first trigger signal is a signal for triggering the to-be-tested chip to perform state switching; according to the invention, the state switching time of the chip to be tested can be acquired under the combined action of the network analyzer and the trigger module, and a complicated test environment does not need to be additionally established, so that the efficiency of acquiring the state switching time of the chip is improved, and the test cost is reduced.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a chip testing device, a chip testing system and a data collection method. Background technique [0002] With the development of communication technology, people have higher and higher requirements on the performance of chips. Exemplarily, in various inspections and verifications of radio frequency chips, testing is an important part of checking chip quality. By testing the performance of the chip, it can be accurately evaluated whether the chip meets the actual application requirements. In the field of testing, for testing devices such as chips, automatic test equipment (ATE, Automatic Test Equipment) is usually used to test different performances of devices such as chips. In some specific application scenarios, when testing the different performances of chips and other devices, it will be necessary to collect the state switching time of chips and other devices. The complex t...

Claims

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Application Information

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IPC IPC(8): G01R31/28
Inventor 林楷辉倪建兴
Owner RADROCK (SHENZHEN) TECH CO LTD
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