50 results about "Network analyzer (electrical)" patented technology

The invention provides a method for measuring impedance of a capacitively coupled plasma source, which comprises the following steps of: under the condition that plasma is not ignited, dividing a cavity into an upper part and a lower part along an electrical middle plane, and establishing an equivalent circuit model comprising five elements to be determined; three measurement ports are defined, five independent measurement boundary conditions are set, sweep frequency measurement is carried out by using a network analyzer, and multiple groups of Z parameter data are obtained; then, on each frequency point, joint fitting is carried out on a theoretical impedance expression of the equivalent circuit and actually measured data, and parameter values of all undetermined elements are solved; and finally, outputting a parameter curve of each element along with frequency change and a cavity equivalent impedance spectrum. According to the method, the problem that equivalent parameters cannot be identified is solved through multi-working-condition data redundancy, universal, accurate and reproducible measurement of the impedance of the pure cavity is realized, and a reliable quantitative basis is provided for matching network design, process window prediction and cavity optimization.

The invention provides a near-field scanning rapid imaging device for the radio frequency performance of a multi-channel electrically tunable base station antenna, and relates to the technical field of radio frequency antenna testing, the device comprises a scanning assembly and a data processing module, the scanning assembly is composed of a radio frequency probe installed on a two-dimensional precision displacement platform and a vector network analyzer connected with the radio frequency probe, and the data processing module is connected with the scanning assembly. The scanning module is used for performing point-by-point scanning in an antenna near-field area along a preset plane grid path and collecting scattering parameters representing electromagnetic field characteristics at sampling points to form a near-field scanning data set; and the data processing module receives the data set, executes fast Fourier transform operation, and converts near-field data into far-field radiation characteristics so as to generate a far-field radiation pattern representing the radio frequency performance of the antenna. And the data processing module applies a preset static compensation matrix to the near-field data before conversion, so that the mutual coupling effect between the probe and the antenna is inhibited, and the accuracy of a measurement result is improved.

The utility model provides a test system applied to an electrical performance test of an electronic component, particularly relates to the technical field of electronic test, and comprises a main control computer, a vector network analyzer, a multi-channel switching module and a tested electronic component interface module. The system is communicated with the vector network analyzer through the main control computer, so that sending and receiving of a test instruction are realized. The vector network analyzer outputs test signals, and the test signals are distributed to a plurality of test ports of the tested electronic component interface module through the multi-channel switching module. The tested electronic component interface module is connected with a plurality of electronic components, transmits test signals and receives feedback. According to the system, the efficiency and the accuracy of the electrical performance test of the electronic component are remarkably improved, the labor cost and the operation error rate are reduced, and the technical problems of low test efficiency and large error are effectively solved.

The utility model discloses a cable test fixture, which comprises a fixture bottom plate, a circuit board positioning cavity is arranged at the rear end of the fixture bottom plate, a PCB (printed circuit board) is mounted in the circuit board positioning cavity, and a socket connector for plugging a measuring head of a network analyzer is arranged on the PCB; an inner conductor connector is installed in the middle of the jig bottom plate, the inner conductor connector is provided with a connecting groove used for being inserted into an inner conductor of a cable, a metal contact piece is arranged in the connecting groove, and the socket connector, the PCB and the metal contact piece are electrically connected in sequence; the middle part of the jig bottom plate is also provided with an inner conductor pressing assembly; the inner conductor pressing assembly is used for pressing the inner conductor of the cable on the metal contact piece; a metal pressing block is installed at the front end of the jig bottom plate and used for pressing the cable, making contact with an outer conductor of the cable and enabling the outer conductor of the cable to be grounded. According to the utility model, when the network analyzer tests the electrical performance of the cable, the reliability of the test performance can be ensured, the test convenience is high, and the test efficiency is high.

The invention relates to the technical field of wireless communication, in particular to an antenna comprehensive measurement and control experiment device which comprises a rail base and a movable frame, a transmitting antenna sampling frame is arranged at the top of a sliding table, a receiving antenna sampling frame is fixed to the right side of the rail base, and a holder is fixedly installed at the top of the receiving antenna sampling frame. The computer display screen is electrically connected with an antenna measurement controller and a vector network analyzer through cables. According to the antenna comprehensive measurement and control system based on virtuality and reality combination and the experimental device, according to the characteristics of radio wave propagation and antenna radiation, proper materials are selected, the structure of an antenna sampling frame system is scientifically constructed, a control circuit is designed to intelligently control the translation, levelness, polarization and other degrees of freedom of a test antenna, and by planning and designing a software interface and a process, the comprehensive measurement and control of the antenna is realized. And a controller of the vector network analyzer and the sampling frame is controlled by a program, related measurement of the antenna is carried out according to set steps, and a test result is efficiently processed and displayed.

The application discloses a kind of LED modulation bandwidth fast test system, including direct-current power supply;Biaser;Laser, for exciting LED sample to emit light, realize the transformation of optical signal-electrical signal-optical signal;Transmission component, for focusing overall light;Optical filter, for excluding the influence of laser on LED light emission;Photoelectric detector, detect the light signal emitted by LED, and change into electrical signal output;Vector network analyzer, analyze two-port signal to draw frequency response curve, so as to obtain the modulation bandwidth of LED.The application can realize the function of testing the communication performance of LED without packaging, and can realize the function of measuring the modulation bandwidth of multiple LEDs simultaneously by laser scanning.Using the device of the application can realize fast measurement, and optical excitation can achieve the effect of zero damage to LED sample.

The application discloses a kind of calibration chip sets for calibrating error factor of chip to be measured, the calibration chip set includes short-circuit calibration chip, open-circuit calibration chip, matching load calibration chip and straight-through calibration chip, any calibration chip in the calibration chip set is identical with the size of the chip to be measured, wherein the test pin of the short-circuit calibration chip is short-circuit connected with the ground metal layer itself;The test pin of the open-circuit calibration chip is open between the ground metal layer itself;The test pin of the matching load calibration chip is connected with the ground metal layer itself through load resistance;Two test pins of the straight-through calibration chip are electrically connected between the two test pins of the straight-through relationship on the straight-through calibration chip.The calibration chip used in the application directly sets the calibration reference surface of the vector network analyzer at the pin of the packaged chip, without additional consideration of the parasitic parameter introduced by the test fixture, improves the test accuracy of the chip, simplifies the calibration step and test data processing process.

The present invention discloses a transmission line with electrical length markings, its continuous marking method, and a transmission line assembly. On the outer surface of the transmission line, a plurality of electrical length markings with intervals are formed along the length direction of the transmission line itself. The distance between adjacent markings corresponds to the propagation distance of the signal within a preset time unit d. The electrical length τ satisfies τ = (n - 1)·d + ε, where n is a natural number greater than or equal to 2, 0 ≤ ε < d, and the number of markings corresponds to the integer index n. During manufacturing, the continuous wire is placed on a production line with tension control, the displacement is measured by a grating, and the phase is measured by a non-contact capacitive probe in cooperation with a vector network analyzer. The electrical length at each position is calculated, and the marking module is driven at a d interval to continuously mark and shipped in rolls. In this way, the electrical length of the transmission line can be identified, recorded, and circulated. During assembly, it is cut according to the physical length or electrical length. The number of electrical length markings N of each wire segment is equal to each other, and the electrical length markings at both ends are aligned, so as to achieve the consistency of the propagation time between differential pairs and between multiple channels.

This invention discloses a method for detecting the phase center of a Beidou navigation antenna and communication antenna feed, belonging to the field of satellite navigation and communication technology. Specifically, it includes the following steps: S1, connecting the transmitting antenna, transmitting turntable, vector network analyzer, computer, printer, antenna turntable, and antenna under test in a microwave anechoic chamber; S2, adjusting the antenna under test and the transmitting antenna using a laser beam to ensure consistent measurement standards. The microwave anechoic chamber is covered on all six sides with shielding and absorbing materials, effectively isolating external electromagnetic interference and creating a reflection-free, low-interference testing environment. This avoids distortion of phase measurement data due to external electromagnetic signal coupling, ensuring that the test results accurately reflect the antenna's inherent characteristics. Strict limits are imposed on parameters such as the quiet zone size, humidity, temperature, and atmospheric pressure of the microwave anechoic chamber to reduce the impact of slowly changing environmental factors such as temperature and humidity on the antenna's electrical performance, ensuring consistent testing conditions.

This invention relates to the field of electrical performance testing technology for nanoscale thin films, and in particular to a method for testing the dielectric constant and Q value of nanoscale thin films using a network analyzer. The method includes the following steps: S1: Preparing electrodes on the surface of the thin film to be tested, and forming a capacitor with the film; S2: Connecting the electrodes to the network analyzer using a probe station, and performing impedance matching on the circuit before connection; S3: Measuring the resonant frequency of the thin film under test at different frequencies and the S21 parameter at those resonant frequencies; S4: Calculating the capacitance and Q value of the thin film at different frequencies using the S parameters measured in S3; S5: Calculating the dielectric constant of the thin film at different frequencies using the capacitance obtained in S4. This invention has the advantage of simultaneously measuring the Q value of the thin film; and it can be tested at GHz frequencies, offering the advantage of high testing frequency. This invention achieves simultaneous testing of the dielectric constant and Q value of nanoscale thin film dielectrics, featuring accurate test results and high testing frequency.

The invention relates to a reflectivity testing method based on a double-arch-shaped-frame high-temperature reflectivity testing system, and the double-arch-shaped-frame high-temperature reflectivity testing system comprises two semicircular arch-shaped frames, two linear guide rails, a sample support, an upper heating device, a single-pole multi-throw radio frequency switch, a vector network analyzer, and a controller. The two semicircular arch-shaped frames and the two linear guide rails are arranged in parallel, the sample support is arranged below the linear guide rails, the center of the linear guide rails and the center of the top of the sample support are coplanar, the upper heating device is arranged above the sample support, and a plurality of antennas with different frequency bands are arranged on the linear guide rails in a sliding mode. The antennas of different frequency bands on the linear guide rail are electrically connected to the vector network analyzer through the single-pole multi-throw radio frequency switch, and the vector network analyzer is electrically connected to the controller. The device has the beneficial effects that the antenna pointing is accurate, the switching is convenient, the influence of a thermal insulation material and a heating device on the test during the test can be eliminated, and the working efficiency is improved.

The application provides a near-field scanning fast imaging device for radio frequency performance of a multi-channel electrically adjustable base station antenna, and relates to the technical field of radio frequency antenna testing.The device comprises a scanning component and a data processing module.The scanning component is composed of a radio frequency probe installed on a two-dimensional precision displacement platform and a connected vector network analyzer, is used for point-by-point scanning along a preset planar grid path in the near-field area of the antenna, and collects scattering parameters representing electromagnetic field characteristics at each sampling point to form a near-field scanning data set.The data processing module receives the data set and performs a fast Fourier transform operation to convert the near-field data into far-field radiation characteristics, thereby generating a far-field radiation pattern representing the radio frequency performance of the antenna.A preset static compensation matrix is applied to the near-field data by the data processing module before transformation to suppress the mutual coupling effect between the probe and the antenna and improve the accuracy of the measurement results.

The application discloses a kind of high-speed EML laser chirp test methods, current voltage source table and PNA vector network analyzer are respectively connected with the high-speed EML sample to be measured electrically, the high-speed EML sample to be measured, fiber splitter, optical fiber module, O / E photoelectric conversion module are sequentially connected with light, APT automatic coupling system and fiber splitter are connected with light, O / E photoelectric conversion module and PNA vector network analyzer are connected with electricity, PC control and data processing system and PNA vector network analyzer, current voltage source table and APT automatic coupling system are connected with data, optical fiber module is the module that is connected with light by standard single-mode optical fiber SSMF and optical amplifier;The test method in the application is calculated by the parameter of standard single-mode optical fiber, and the dispersion parameter can be calculated by substituting the light wavelength; increase EDFA and PDFA or SOA butterfly device, compensate the light power attenuation after long fiber, ensure that test result is more accurate.

A kind of vector network analyzer includes: shell, circuit board being arranged in shell, radio frequency component module, circuit board includes: backboard, control module being electrically connected with backboard, radio frequency component module includes: shielded cavity, source component being arranged in shielded cavity, receiver component being arranged in shielded cavity, radio frequency port, with the docking interface of backboard electrically connected, backboard is provided with multiple docking slot positions with radio frequency component module docking, multiple docking slot positions are same, the docking interface of different radio frequency component module is same and is connected with docking slot position docking;The above-mentioned vector network analyzer is modularized design, radio frequency component module can be used to be combined into any port number VNA, improve the flexibility and efficiency of production assembly, reduce cost, backboard is provided with multiple docking slot positions with radio frequency component module docking, multiple docking slot positions are same, radio frequency component module can be plugged into any docking slot position according to need, improve assembly efficiency.

This invention belongs to the field of electrical parameter measurement and discloses a design, single calibration and measurement method for a radio frequency impedance measurement fixture. The design method includes: adopting a symmetrical structure, using a coaxial SMA connector as the port for connection with a vector network analyzer (VNA), using a coplanar waveguide as the connection line between the SMA connector and the device under test (DUT), and setting four surface mount pads on the coplanar waveguide to realize a radio frequency impedance measurement fixture for DUTs with different packages and different impedance ranges.

This specification provides a near-field communication (NFC) device testing fixture, system, method, apparatus, and medium. The solution includes: a near-field coupling antenna for near-field electromagnetic coupling with the near-field communication antenna of the device under test (DUT); a radio frequency (RF) switch electrically connected to the near-field coupling antenna; and a control unit communicatively connected to the RF switch, configured to: in response to a control command, control the RF switch to connect the near-field coupling antenna to a network analyzer to perform passive RF performance testing of the DUT; and control the RF switch to connect the near-field coupling antenna to a near-field communication reader / writer to perform active interactive testing of the DUT.

A dual-mode composite energetic material out-of-cavity active regulation and control ignition system comprises an electric control displacement platform, an upper computer, a vector network analyzer, a microwave signal source, a power amplifier, a directional coupler and a power measurement and display unit, and the electric control displacement platform is connected with a high-temperature-resistant vessel and a microwave resonant cavity. The microwave resonant cavity comprises a metal outer cavity, the metal outer cavity is a hollow cylinder with an opening in the lower end, a bottom cover with a hole is arranged at the lower end opening of the metal outer cavity, the bottom cover with the hole is of an annular shutter structure with an opening in the center, a center probe is further coaxially arranged in the metal outer cavity, and the center probe penetrates through the center opening of the bottom cover with the hole from inside to outside and extends outwards. Switching of two ignition mechanisms is realized by regulating and controlling microwave parameters and ignition areas, and the ignition process suitable for most composite energetic materials is realized; the method can be used for research, development and verification of novel energetic materials and quality detection and real-time ignition of solid rocket propellants, and has very important military application value and scientific research value.

A measurement device, e.g., a vector network analyzer, for analyzing a device-under-test, DUT is provided. The measurement device comprises a signal generator to generate a test signal; test ports, connected to the DUT, which forward the test signal to the DUT, and / or receive a response signal from the DUT; and signal paths electrically connected the signal generator by one of the test ports. At least one of the signal paths comprises: a measurement unit to measure RF signals; a reference coupler to forward a decoupled portion of the test signal; a first measurement coupler to forward a first decoupled portion of the response signal; and a second measurement coupler to forward a second decoupled portion of the response signal. The second measurement coupler adapts a characteristic of the second decoupled portion of the response signal to differ from the first decoupled portion of the response signal.

1. The name of the design product: Vector Network Analyzer (MNA4-75). 2. The use of the design product: It is used in the field of measuring electrical network parameters, and is a special instrument for measuring transmission, reflection, impedance and S parameter in the design and production process. 3. The design points of the design product: in shape. 4. The picture or photo that best shows the design points: perspective view 1.

The invention provides a surface mount filter parameter automatic test system, which belongs to the technical field of electronic component test and comprises a multi-station test device, a master control and data acquisition system, a network analyzer and a power supply. The multi-station testing device comprises a first installation platform, a second installation platform, a testing platform, a testing carrying disc, a testing support and a testing terminal. The main control and data acquisition system is electrically connected with the multi-station test device and is used for controlling the displacement of the test loading disc and the test terminal, acquiring test data, processing the data and generating a test report; the network analyzer is connected with the multi-station testing device and the master control and data acquisition system, and is used for carrying out electrical performance parameter testing on the surface mount filter. Compared with a traditional manual test, full-automatic testing is achieved, and testing of large-batch products is facilitated. The invention further relates to a testing method of the automatic testing system for the parameters of the surface-mounted filter.

The application discloses a F-P demodulation method, system and medium based on a swept light source and a microwave photon, and the method comprises the following steps: 1) a swept light source outputs an optical signal, and a microwave is generated by a vector network analyzer; 2) a circulator transmits the optical signal to an F-P sensor, the F-P sensor generates an interference spectrum, and the circulator outputs the interference spectrum to an electro-optic modulator; 3) the electro-optic modulator receives the interference spectrum and the microwave, and intensity modulates the interference spectrum and the microwave to obtain a modulated optical signal; 4) the modulated optical signal is transmitted to a photoelectric detector, the photoelectric detector converts the optical signal into an electrical signal, and the electrical signal is input into the vector network analyzer; and 5) the vector network analyzer processes the collected signal to calculate an F-P cavity length L. The system comprises a swept light source, an F-P sensor, a circulator, a vector network analyzer, an electro-optic modulator and a photoelectric detector; and the application greatly improves the sensitivity of the F-P demodulation system.

The application provides a method for measuring the impedance of a capacitive coupling plasma source, which comprises the following steps: under the condition that no plasma is ignited, a cavity is divided into an upper part and a lower part along an electrical median plane, and an equivalent circuit model containing five undetermined elements is established; three measurement ports are defined, five kinds of independent measurement boundary conditions are set, sweep measurement is carried out by using a network analyzer, and multiple sets of Z parameter data are obtained; then at each frequency point, a theoretical impedance expression of the equivalent circuit is combined with the measured data for joint fitting, and the parameter values of all the undetermined elements are solved; finally, the parameter curves of each element varying with frequency and the equivalent impedance spectrum of the cavity are output. The application solves the problem of indistinguishable equivalent parameters through redundant multi-working condition data, realizes general, accurate and reproducible measurement of the pure cavity impedance, and provides a reliable quantitative basis for matching network design, process window prediction and cavity optimization.

The application discloses a kind of active standing wave test systems of phased array antenna, including matrix switch network, vector network analyzer and control computer, matrix switch network includes M level matrix switch, the number of matrix switch unit arranged in the p level matrix switch is (N / 2) (p‑1) Each matrix switch unit includes 2 input ports and N output ports, there is a two-way electrically controlled switch between any one output port of matrix switch unit and its 2 input ports, the communication port of vector network analyzer is connected with the input port of the matrix switch unit arranged in the first level in the matrix switch network;The output port OUT_y-1 of the kth matrix switch unit of the p level in the matrix switch network, OUT_y is respectively connected to the input port IN_1, IN_2 of the (k-1)*N / 2+y / 2 matrix switch unit of the p+1 level;The application effectively reduces the test hardware cost.

This invention discloses a testing system and method for packaged antennas, relating to the field of antenna technology. It solves the problem that existing probe station and socket testing methods are unsuitable for testing the electrical and radio frequency (RF) performance of AOP-packaged antennas with integrated antennas. The key technical points are: By using an electrically connected DC power supply, a vector network analyzer, a host computer, and a receiving antenna connected to the vector network analyzer, low-cost electrical and RF performance testing of AOP-packaged antennas with integrated antennas is achieved. The host computer controls the testing process, achieving high efficiency, high stability, and consistency. A "golden module" is used for calibration, ensuring the accuracy of screening tests. The calibration data of the AOP-packaged antennas is stored, allowing calibration of phased array antennas composed of several AOP-packaged antennas to be performed on a per-AOP-packaged-antenna basis, improving the calibration efficiency of phased array antennas.

The invention belongs to the technical field of radio frequency filter detection, particularly relates to an automatic debugging and measuring system and process for a radio frequency filter, and aims to overcome the defect of low detection efficiency of the radio frequency filter in the prior art. A vertical plate is fixedly mounted at the top of the base, the debugging system further comprises a driving motor, the driving motor is fixedly mounted at the top of one side of the vertical plate, and a transmission shaft is fixedly mounted on an output shaft of the driving motor. According to the radio frequency filter debugging device, the driving motor is started, so that the plurality of radio frequency filters can be sequentially carried when the driving motor is started, the plurality of radio frequency filters can sequentially pass through the debugging area, the plurality of radio frequency filters can be debugged one by one, and a manual debugging mode can be replaced; the electrical performance of the radio frequency filter is detected by using the network analyzer and the radio frequency cable, and debugging and detection are integrated.

The invention relates to the technical field of performance testing, in particular to a testing tool for an NMD flange connector and a testing method of the testing tool. One end of the NMD flange connector is connected with the product to be detected through the detection unit, an inner conductor on the other side of the NMD flange connector is connected with an inner conductor of the vector network analyzer, and an outer conductor of the vector network analyzer is fixed on a flange plate of the NMD flange connector, so that signals can be transmitted in a low-loss and low-reflection manner; the calculation unit determines a reflection loss value based on the received detection data transmitted by the detection unit; and a test state is determined based on the average value of the reflection loss values in the preset period through an analysis unit, and related parameters are adjusted based on the test state. According to the invention, the efficiency of testing the electrical performance of the NMD flange connector is improved.

This invention relates to the field of performance testing technology, and more particularly to a testing fixture and method for NMD flange connectors. The invention connects one end of the NMD flange connector to the product under test via a detection unit, and the inner conductor of the other side of the NMD flange adapter is connected to the inner conductor of a vector network analyzer. The outer conductor of the vector network analyzer is fixed to the flange of the NMD flange adapter, enabling signal transmission with low loss and low reflection. A calculation unit determines the reflection loss value based on the detection data received from the detection unit, and an analysis unit determines the test state based on the average reflection loss value over a preset period, adjusting relevant parameters accordingly. This invention improves the efficiency of electrical performance testing of NMD flange connectors.

The invention discloses a decorative part testing jig, and belongs to the technical field of testing. The embodiment of the invention provides a decorative part testing jig. The decorative part testing jig comprises a bearing mechanism, a pressing mechanism and a testing mechanism. The bearing mechanism is provided with a bearing surface, and the bearing surface is provided with a test area suitable for placing a to-be-tested decorative part. The testing mechanism comprises a feed testing line, a grounding testing line, a feed probe and at least one grounding probe, one end of the feed probe is exposed out of the testing area, and the other end of the feed probe is electrically connected with the feed testing line. One end of the grounding probe is exposed out of the test area, and the other end is electrically connected with the grounding test wire. The feed test line and the grounding test line are suitable for being electrically connected with a network analyzer. At least one part of the pressing mechanism can move towards and away from the bearing face. By adopting the decorative part test fixture provided by the embodiment of the invention, the performance of the to-be-tested decorative part serving as the antenna can be tested independently, and the detection efficiency of the performance of the to-be-tested decorative part is improved.

The application relates to a reflectivity testing method based on a double-arch high-temperature reflectivity testing system, and the double-arch high-temperature reflectivity testing system comprises semicircular arches, linear guides, sample supports, upper heating devices, single-pole multi-throw radio frequency switches, vector network analyzers and controllers, two semicircular arches and two linear guides are arranged in parallel, the sample supports are arranged below the linear guides and the centers of the linear guides and the centers of the top portions of the sample supports are coplanar, the upper heating devices are arranged above the sample supports, a plurality of antennas with different frequency bands are slidably arranged on the linear guides, the antennas with different frequency bands on the linear guides are electrically connected to the vector network analyzers through the single-pole multi-throw radio frequency switches, and the vector network analyzers are electrically connected to the controllers. The application has the beneficial effects that the antennas are accurately pointed and conveniently switched, the influences of the heat preservation materials and the heating devices on the testing can be eliminated, and the working efficiency is improved.