77 results about "Network analyzer (electrical)" patented technology

The utility model discloses a portable vector network analyzer which comprises a shell, an energy storage power supply, a display control panel, an external interface, a numerical control circuit board and a radio frequency circuit board. The energy storage power supply is used for providing a working power supply, the display control panel is used for displaying and controlling the portable vector network analyzer, the external interface is used for connecting peripheral equipment, and the radio frequency circuit board is used for converting a radio frequency signal input by the radio frequency input and output port into an intermediate frequency signal and then sending the intermediate frequency signal to the numerical control circuit board; and the numerical control circuit board is used for performing electrical parameter analysis on the intermediate frequency signal and displaying an electrical parameter analysis result through the display control panel. As the working power supply is provided by the energy storage power supply, the vector network analyzer can be ensured to continuously work for a long time without an external power supply, and a complete test function of a common vector network is provided.

The invention relates to the technical field of signal integrity detection, in particular to a backboard and daughter board and bottom board combined full-link simulation signal integrity detection method, which comprises the following steps of: connecting all circuit boards to obtain a connected circuit board; performing electrical performance evaluation on the connection circuit board by using a network analyzer; analyzing the topology of the connection circuit board, and confirming the worst condition of the connection circuit board; according to the method, high-speed channel modeling is carried out on a connection circuit board, and eye pattern simulation after cascading is carried out, signal detection can be carried out on a backboard and daughter board and bottom board all-link, the signal condition of each link is detected, meanwhile, the whole signal is analyzed through modeling, simulation signals are rapidly detected, and the detection efficiency is improved. Meanwhile, the IBIS model is used for analyzing signal sending and receiving, so that data are more accurate, efficiency is higher, and the problem that it cannot be determined that a circuit board can have complete operation signals when an existing backboard is combined with a daughter board and a bottom board to be delivered is solved.

The invention relates to the technical field of material physical property testing, in particular to a ferromagnetic resonance linewidth automatic testing system and method, and the system comprises a main control unit, a signal generator, a spectrum analyzer, a magnetic field generation device, a gauss meter, a microwave transmission structure and two attenuators. The signal generator, the spectrum analyzer, the magnetic field generation device and the gauss meter are electrically connected with the main control unit, one attenuator is connected between the signal generator and the microwave transmission structure, the other attenuator is connected between the microwave transmission structure and the spectrum analyzer, and a crystal oscillator synchronization line is connected between the spectrum analyzer and the signal generator. The method comprises the following steps of: scanning point by point to read the readings of a spectrum analyzer influenced by a sample under different frequencies and different magnetic field intensities, and performing data curve fitting according to three groups of data of the frequency, the magnetic field intensity and the power to obtain a ferromagnetic resonance line width result of the sample; the signal generator and the spectrum analyzer are cheaper than the network analyzer.

The invention provides a method for measuring impedance of a capacitively coupled plasma source, which comprises the following steps of: under the condition that plasma is not ignited, dividing a cavity into an upper part and a lower part along an electrical middle plane, and establishing an equivalent circuit model comprising five elements to be determined; three measurement ports are defined, five independent measurement boundary conditions are set, sweep frequency measurement is carried out by using a network analyzer, and multiple groups of Z parameter data are obtained; then, on each frequency point, joint fitting is carried out on a theoretical impedance expression of the equivalent circuit and actually measured data, and parameter values of all undetermined elements are solved; and finally, outputting a parameter curve of each element along with frequency change and a cavity equivalent impedance spectrum. According to the method, the problem that equivalent parameters cannot be identified is solved through multi-working-condition data redundancy, universal, accurate and reproducible measurement of the impedance of the pure cavity is realized, and a reliable quantitative basis is provided for matching network design, process window prediction and cavity optimization.

The invention provides a near-field scanning rapid imaging device for the radio frequency performance of a multi-channel electrically tunable base station antenna, and relates to the technical field of radio frequency antenna testing, the device comprises a scanning assembly and a data processing module, the scanning assembly is composed of a radio frequency probe installed on a two-dimensional precision displacement platform and a vector network analyzer connected with the radio frequency probe, and the data processing module is connected with the scanning assembly. The scanning module is used for performing point-by-point scanning in an antenna near-field area along a preset plane grid path and collecting scattering parameters representing electromagnetic field characteristics at sampling points to form a near-field scanning data set; and the data processing module receives the data set, executes fast Fourier transform operation, and converts near-field data into far-field radiation characteristics so as to generate a far-field radiation pattern representing the radio frequency performance of the antenna. And the data processing module applies a preset static compensation matrix to the near-field data before conversion, so that the mutual coupling effect between the probe and the antenna is inhibited, and the accuracy of a measurement result is improved.

The present invention discloses a closed metal shell internal structure monitoring system, including a transmitting antenna extending into the metal shell for transmitting electromagnetic waves into the closed shell; a wavefront modulator installed inside the metal shell, which is connected to a circuit board and a computer for modulating the electromagnetic waves in the metal shell, and the wavefront modulator includes a plurality of modulation units, and each modulation unit can be controlled to be turned on or off by a computer and a circuit board; a receiving antenna for receiving electromagnetic waves in the metal shell, and a network analyzer electrically connected to the transmitting antenna and the receiving antenna, respectively. The present invention also provides a monitoring method for the closed metal shell internal structure monitoring system. The present invention can judge the changes in different parts of the internal structure of the closed metal shell by the changes in the electromagnetic wave transmission amplitude between the transmitting antenna and the receiving antenna, thereby realizing real-time monitoring of the internal structure of the closed metal shell.

The utility model provides a test system applied to an electrical performance test of an electronic component, particularly relates to the technical field of electronic test, and comprises a main control computer, a vector network analyzer, a multi-channel switching module and a tested electronic component interface module. The system is communicated with the vector network analyzer through the main control computer, so that sending and receiving of a test instruction are realized. The vector network analyzer outputs test signals, and the test signals are distributed to a plurality of test ports of the tested electronic component interface module through the multi-channel switching module. The tested electronic component interface module is connected with a plurality of electronic components, transmits test signals and receives feedback. According to the system, the efficiency and the accuracy of the electrical performance test of the electronic component are remarkably improved, the labor cost and the operation error rate are reduced, and the technical problems of low test efficiency and large error are effectively solved.

The present invention provides a microstrip antenna sensor and a salt solution concentration measurement system and method. The microstrip antenna sensor includes a dielectric substrate, on one side of which there is a metal disk; on the other side there is a CSRR structure ground plane and a coaxial feeding structure; the metal disk is used as an antenna radiator to penetrate into the salt solution to be measured to sense the change in the dielectric constant of the salt solution, and the CSRR structure ground plane is a split metal ring structure, and the resonant frequency of the microstrip antenna sensor is adjusted by adjusting the geometric parameters of the split metal ring. By detecting the resonant frequency (reflection coefficient of the coaxial feeding port) of the microstrip antenna sensor with a vector network analyzer, the concentration value of the salt solution to be measured can be deduced. The size of the microstrip antenna sensor is optimized, and a microwave antenna with an electrical size of only 0.23λ is realized. The microstrip antenna sensor also exhibits high sensitivity, with a sensitivity of 0.367 (kHz / (mg / L)), and can make a rapid and accurate response to small changes in salinity concentration.

The utility model discloses a cable test fixture, which comprises a fixture bottom plate, a circuit board positioning cavity is arranged at the rear end of the fixture bottom plate, a PCB (printed circuit board) is mounted in the circuit board positioning cavity, and a socket connector for plugging a measuring head of a network analyzer is arranged on the PCB; an inner conductor connector is installed in the middle of the jig bottom plate, the inner conductor connector is provided with a connecting groove used for being inserted into an inner conductor of a cable, a metal contact piece is arranged in the connecting groove, and the socket connector, the PCB and the metal contact piece are electrically connected in sequence; the middle part of the jig bottom plate is also provided with an inner conductor pressing assembly; the inner conductor pressing assembly is used for pressing the inner conductor of the cable on the metal contact piece; a metal pressing block is installed at the front end of the jig bottom plate and used for pressing the cable, making contact with an outer conductor of the cable and enabling the outer conductor of the cable to be grounded. According to the utility model, when the network analyzer tests the electrical performance of the cable, the reliability of the test performance can be ensured, the test convenience is high, and the test efficiency is high.

The embodiment of the invention provides an impedance detection circuit, method, device and equipment applied to a switch cabinet, a storage medium and a program product. The circuit comprises a data processing device, a vector network analyzer, a flexible capacitive sensor and a to-be-tested circuit belonging to a switch loop in the switch cabinet, the at least two flexible capacitive sensors and the to-be-tested circuit are connected in series to form a series branch; one end of the series branch is connected with a first port of the vector network analyzer, and the other end of the series branch is connected with a second port of the vector network analyzer; a first port of the vector network analyzer sends out a high-frequency excitation voltage signal, and the first port and a second port receive electrical data generated by the high-frequency excitation voltage signal; and the data processing equipment determines the impedance of the circuit to be tested according to the electrical data and the capacitance value of the flexible capacitive sensor. The circuit is used for achieving the technical effect of accurately measuring the impedance of an electrical connection part in the switch cabinet on the premise of not influencing the normal power supply of the switch cabinet.

The invention relates to the technical field of wireless communication, in particular to an antenna comprehensive measurement and control experiment device which comprises a rail base and a movable frame, a transmitting antenna sampling frame is arranged at the top of a sliding table, a receiving antenna sampling frame is fixed to the right side of the rail base, and a holder is fixedly installed at the top of the receiving antenna sampling frame. The computer display screen is electrically connected with an antenna measurement controller and a vector network analyzer through cables. According to the antenna comprehensive measurement and control system based on virtuality and reality combination and the experimental device, according to the characteristics of radio wave propagation and antenna radiation, proper materials are selected, the structure of an antenna sampling frame system is scientifically constructed, a control circuit is designed to intelligently control the translation, levelness, polarization and other degrees of freedom of a test antenna, and by planning and designing a software interface and a process, the comprehensive measurement and control of the antenna is realized. And a controller of the vector network analyzer and the sampling frame is controlled by a program, related measurement of the antenna is carried out according to set steps, and a test result is efficiently processed and displayed.

The utility model relates to the technical field of automatic test systems, in particular to an automatic test system for a vector network analyzer, which comprises a test computer, a communication converter, a development board, a first programmable power supply, a second programmable power supply, a digital multimeter, a vector network analyzer, a frequency spectrograph and a test board. The communication converter communicates with the USB interface, and the first programmable power supply is electrically connected between the communication converter and the test board; the development board communicates with the serial interface, and the development board is electrically connected with the test board; the second programmable power supply, the digital multimeter, the vector network analyzer and the frequency spectrograph are respectively connected with the test board electric box, and the second programmable power supply, the digital multimeter, the vector network analyzer and the frequency spectrograph are respectively communicated with the network interface through a local area network. According to the automatic testing system, the efficiency is improved, the testing data are more accurate, the performance of the device can be reflected more truly, and meanwhile, the stored data result is also convenient to analyze and process.

A disclosed indirect antenna testing apparatus may include (1) a Near Field Communication (NFC) interface that includes an NFC coil, the NFC interface dimensioned to receive a test NFC device while positioning the test NFC device within an effective range of the NFC coil, and (2) a Vector Network Analyzer (VNA) electrically coupled to the NFC coil and configured to (A) emit a signal via the NFC coil, and (B) monitor for a resonance from the test NFC device within at least one predetermined electromagnetic band. Various additional control devices, apparatuses, systems, and methods are also disclosed.

The application discloses a kind of LED modulation bandwidth fast test system, including direct-current power supply;Biaser;Laser, for exciting LED sample to emit light, realize the transformation of optical signal-electrical signal-optical signal;Transmission component, for focusing overall light;Optical filter, for excluding the influence of laser on LED light emission;Photoelectric detector, detect the light signal emitted by LED, and change into electrical signal output;Vector network analyzer, analyze two-port signal to draw frequency response curve, so as to obtain the modulation bandwidth of LED.The application can realize the function of testing the communication performance of LED without packaging, and can realize the function of measuring the modulation bandwidth of multiple LEDs simultaneously by laser scanning.Using the device of the application can realize fast measurement, and optical excitation can achieve the effect of zero damage to LED sample.

The application discloses a kind of calibration chip sets for calibrating error factor of chip to be measured, the calibration chip set includes short-circuit calibration chip, open-circuit calibration chip, matching load calibration chip and straight-through calibration chip, any calibration chip in the calibration chip set is identical with the size of the chip to be measured, wherein the test pin of the short-circuit calibration chip is short-circuit connected with the ground metal layer itself;The test pin of the open-circuit calibration chip is open between the ground metal layer itself;The test pin of the matching load calibration chip is connected with the ground metal layer itself through load resistance;Two test pins of the straight-through calibration chip are electrically connected between the two test pins of the straight-through relationship on the straight-through calibration chip.The calibration chip used in the application directly sets the calibration reference surface of the vector network analyzer at the pin of the packaged chip, without additional consideration of the parasitic parameter introduced by the test fixture, improves the test accuracy of the chip, simplifies the calibration step and test data processing process.

The present invention discloses a transmission line with electrical length markings, its continuous marking method, and a transmission line assembly. On the outer surface of the transmission line, a plurality of electrical length markings with intervals are formed along the length direction of the transmission line itself. The distance between adjacent markings corresponds to the propagation distance of the signal within a preset time unit d. The electrical length τ satisfies τ = (n - 1)·d + ε, where n is a natural number greater than or equal to 2, 0 ≤ ε < d, and the number of markings corresponds to the integer index n. During manufacturing, the continuous wire is placed on a production line with tension control, the displacement is measured by a grating, and the phase is measured by a non-contact capacitive probe in cooperation with a vector network analyzer. The electrical length at each position is calculated, and the marking module is driven at a d interval to continuously mark and shipped in rolls. In this way, the electrical length of the transmission line can be identified, recorded, and circulated. During assembly, it is cut according to the physical length or electrical length. The number of electrical length markings N of each wire segment is equal to each other, and the electrical length markings at both ends are aligned, so as to achieve the consistency of the propagation time between differential pairs and between multiple channels.

This invention discloses a method for detecting the phase center of a Beidou navigation antenna and communication antenna feed, belonging to the field of satellite navigation and communication technology. Specifically, it includes the following steps: S1, connecting the transmitting antenna, transmitting turntable, vector network analyzer, computer, printer, antenna turntable, and antenna under test in a microwave anechoic chamber; S2, adjusting the antenna under test and the transmitting antenna using a laser beam to ensure consistent measurement standards. The microwave anechoic chamber is covered on all six sides with shielding and absorbing materials, effectively isolating external electromagnetic interference and creating a reflection-free, low-interference testing environment. This avoids distortion of phase measurement data due to external electromagnetic signal coupling, ensuring that the test results accurately reflect the antenna's inherent characteristics. Strict limits are imposed on parameters such as the quiet zone size, humidity, temperature, and atmospheric pressure of the microwave anechoic chamber to reduce the impact of slowly changing environmental factors such as temperature and humidity on the antenna's electrical performance, ensuring consistent testing conditions.

This invention relates to the field of electrical performance testing technology for nanoscale thin films, and in particular to a method for testing the dielectric constant and Q value of nanoscale thin films using a network analyzer. The method includes the following steps: S1: Preparing electrodes on the surface of the thin film to be tested, and forming a capacitor with the film; S2: Connecting the electrodes to the network analyzer using a probe station, and performing impedance matching on the circuit before connection; S3: Measuring the resonant frequency of the thin film under test at different frequencies and the S21 parameter at those resonant frequencies; S4: Calculating the capacitance and Q value of the thin film at different frequencies using the S parameters measured in S3; S5: Calculating the dielectric constant of the thin film at different frequencies using the capacitance obtained in S4. This invention has the advantage of simultaneously measuring the Q value of the thin film; and it can be tested at GHz frequencies, offering the advantage of high testing frequency. This invention achieves simultaneous testing of the dielectric constant and Q value of nanoscale thin film dielectrics, featuring accurate test results and high testing frequency.

The invention relates to a reflectivity testing method based on a double-arch-shaped-frame high-temperature reflectivity testing system, and the double-arch-shaped-frame high-temperature reflectivity testing system comprises two semicircular arch-shaped frames, two linear guide rails, a sample support, an upper heating device, a single-pole multi-throw radio frequency switch, a vector network analyzer, and a controller. The two semicircular arch-shaped frames and the two linear guide rails are arranged in parallel, the sample support is arranged below the linear guide rails, the center of the linear guide rails and the center of the top of the sample support are coplanar, the upper heating device is arranged above the sample support, and a plurality of antennas with different frequency bands are arranged on the linear guide rails in a sliding mode. The antennas of different frequency bands on the linear guide rail are electrically connected to the vector network analyzer through the single-pole multi-throw radio frequency switch, and the vector network analyzer is electrically connected to the controller. The device has the beneficial effects that the antenna pointing is accurate, the switching is convenient, the influence of a thermal insulation material and a heating device on the test during the test can be eliminated, and the working efficiency is improved.

The present invention provides a differential crystal oscillator detection method, system, electronic device, and storage medium, relating to the technical field of oscillator detection. The method is based on a differential crystal oscillator detection device, comprising a network analyzer, a test board, a digital electric meter, and a data processing device. The differential crystal oscillator detection method includes: applying a preset power signal to the differential crystal oscillator via the network analyzer, and obtaining the oscillator's electrical performance parameter values ​​based on the network analyzer; supplying the differential crystal oscillator with a rated voltage, switching the differential crystal oscillator's output frequency via the test board; applying a preset test current to the differential crystal oscillator's detection pin via the test board using the digital electric meter to obtain the oscillator's microcurrent parameter value; and obtaining the oscillator anomaly detection results via the data processing device. The present invention improves the accuracy of differential crystal oscillator anomaly detection.

The present invention discloses a near-field test device and method for electrical performance of a terahertz antenna and a radome, wherein the device comprises a vector network analyzer, a multi-degree-of-freedom turntable, a low-noise amplifier, a first receiving module, a second receiving module, a signal distribution module, a local oscillator source, a transmitting source, a switch, a computer and an I / O interface card, a coupler, a two-dimensional scanning frame, a polarization rotator, a scanning probe, a terahertz antenna, and a radome. The present invention adopts a link coupling method to collect reference signals, which can improve the stability of the reference signals and ensure the measurement accuracy of the phase. The present invention adopts a polarization rotator method to collect near-field electric field components, which avoids the positioning error caused by the rotating polarization probe and is conducive to improving the test accuracy.

The application provides a near-field scanning fast imaging device for radio frequency performance of a multi-channel electrically adjustable base station antenna, and relates to the technical field of radio frequency antenna testing.The device comprises a scanning component and a data processing module.The scanning component is composed of a radio frequency probe installed on a two-dimensional precision displacement platform and a connected vector network analyzer, is used for point-by-point scanning along a preset planar grid path in the near-field area of the antenna, and collects scattering parameters representing electromagnetic field characteristics at each sampling point to form a near-field scanning data set.The data processing module receives the data set and performs a fast Fourier transform operation to convert the near-field data into far-field radiation characteristics, thereby generating a far-field radiation pattern representing the radio frequency performance of the antenna.A preset static compensation matrix is applied to the near-field data by the data processing module before transformation to suppress the mutual coupling effect between the probe and the antenna and improve the accuracy of the measurement results.

The application discloses a kind of high-speed EML laser chirp test methods, current voltage source table and PNA vector network analyzer are respectively connected with the high-speed EML sample to be measured electrically, the high-speed EML sample to be measured, fiber splitter, optical fiber module, O / E photoelectric conversion module are sequentially connected with light, APT automatic coupling system and fiber splitter are connected with light, O / E photoelectric conversion module and PNA vector network analyzer are connected with electricity, PC control and data processing system and PNA vector network analyzer, current voltage source table and APT automatic coupling system are connected with data, optical fiber module is the module that is connected with light by standard single-mode optical fiber SSMF and optical amplifier;The test method in the application is calculated by the parameter of standard single-mode optical fiber, and the dispersion parameter can be calculated by substituting the light wavelength; increase EDFA and PDFA or SOA butterfly device, compensate the light power attenuation after long fiber, ensure that test result is more accurate.

A device and method for dispersion control of an ultrashort pulse laser system. The device includes a light source system, a dispersion detection system, and a control system. The light source system consists of a narrowband tunable light source, a wavelength meter, an amplitude modulator, an electrical amplifier, and a radio frequency signal source, and is used to achieve wavelength adjustment and amplitude modulation of the optical signal. The dispersion detection system consists of a high-speed photodiode and a vector network analyzer, and is used to measure the group delay and dispersion of the ultrashort pulse laser system and provide the results to the control system. The control system is used to control the output wavelength of the light source system to achieve optical frequency sweeping, and according to the measurement results of the dispersion detection system, output control signals to separately adjust the fine compressor and the delay regulator in the ultrashort pulse laser system, and achieve precise control of the system group delay dispersion and group delay through cyclic iteration. In this method, after optical signals with different central wavelengths pass through the system under test and are converted into high-frequency electrical signals by the photodiode, only by measuring the phase change amount between different electrical signals can the dispersion measurement of the laser system be achieved. It is applicable not only to the dispersion control of the ultrashort pulse laser system, but also to the dispersion calibration of a single component.

A kind of vector network analyzer includes: shell, circuit board being arranged in shell, radio frequency component module, circuit board includes: backboard, control module being electrically connected with backboard, radio frequency component module includes: shielded cavity, source component being arranged in shielded cavity, receiver component being arranged in shielded cavity, radio frequency port, with the docking interface of backboard electrically connected, backboard is provided with multiple docking slot positions with radio frequency component module docking, multiple docking slot positions are same, the docking interface of different radio frequency component module is same and is connected with docking slot position docking;The above-mentioned vector network analyzer is modularized design, radio frequency component module can be used to be combined into any port number VNA, improve the flexibility and efficiency of production assembly, reduce cost, backboard is provided with multiple docking slot positions with radio frequency component module docking, multiple docking slot positions are same, radio frequency component module can be plugged into any docking slot position according to need, improve assembly efficiency.

This invention belongs to the field of electrical parameter measurement and discloses a design, single calibration and measurement method for a radio frequency impedance measurement fixture. The design method includes: adopting a symmetrical structure, using a coaxial SMA connector as the port for connection with a vector network analyzer (VNA), using a coplanar waveguide as the connection line between the SMA connector and the device under test (DUT), and setting four surface mount pads on the coplanar waveguide to realize a radio frequency impedance measurement fixture for DUTs with different packages and different impedance ranges.

This specification provides a near-field communication (NFC) device testing fixture, system, method, apparatus, and medium. The solution includes: a near-field coupling antenna for near-field electromagnetic coupling with the near-field communication antenna of the device under test (DUT); a radio frequency (RF) switch electrically connected to the near-field coupling antenna; and a control unit communicatively connected to the RF switch, configured to: in response to a control command, control the RF switch to connect the near-field coupling antenna to a network analyzer to perform passive RF performance testing of the DUT; and control the RF switch to connect the near-field coupling antenna to a near-field communication reader / writer to perform active interactive testing of the DUT.

The present invention discloses a chip testing device, which includes a network analyzer and a trigger module. The network analyzer, the trigger module and the chip to be tested are electrically connected. The network analyzer is configured to send a trigger instruction to the trigger module and collect the state switching time of the chip to be tested. The trigger module is configured to send a first trigger signal to the chip to be tested in response to the trigger instruction, where the first trigger signal is a signal for triggering the chip to be tested to perform a state switch. Through the combined action of the network analyzer and the trigger module, the collection of the state switching time of the chip to be tested can be achieved without the need to additionally build a complex test environment, thereby not only improving the efficiency of collecting the state switching time of the chip, but also reducing the test cost.

The invention provides an instantaneous frequency measurement system and method based on a phase modulator, and the system is connected with a vector network analyzer, and comprises a light source module which is used for providing an optical carrier; the modulation module is used for modulating the fed radio frequency microwave signal onto an optical carrier to obtain an optical modulation signal; the wavelength division multiplexing module is used for separating positive and negative first-order sidebands of the optical modulation signal into a first optical modulation signal and a second optical modulation signal; the detection module is used for respectively converting the first light modulation signal and the second light modulation signal into a first electric signal and a second electric signal; the coupling module is used for combining the first electric signal and the second electric signal to form an output electric signal; wherein the vector network analyzer is respectively connected with the modulation module and the coupling module, and the vector network analyzer receives the output electric signal, obtains a power spectrum of the output electric signal and reversely deduces instantaneous frequency information of the radio frequency microwave signal. The system is high in integration level and strong in anti-electromagnetic interference capability, and is suitable for various scenes.