55 results about "Network analyzer (electrical)" patented technology

A design of an integrated circuit device, in which locations of power wires and memory/logic circuitry are known, is analyzed by at least: identifying intersections of power wires with one another, for power wires that are electrically connected to one another through vias; segmenting power wires, at their intersections; preparing estimates of conductance of vias and wire segments in the form of conductance matrix G; and preparing estimates of current I at each intersection based on power consumed by surrounding circuitry, and current vector “I” and conductance matrix “G” are used to solve for voltage drop ΔV, in a matrix equation GΔV=I, and the voltage drop is displayed, to allow a human to make changes in the design. Pins of unconnected hard macros are temporarily connected to their closest wires, and current therethrough is included in the estimates.

The invention relates to a radar cross section test system and a detection method. The test system comprises a darkroom, and a detection robot, a vector network analyzer, a radio frequency transceiving device, a to-be-tested piece robot, a tray and wave-absorbing baffle plates which are arranged in the darkroom, wherein the radio frequency transceiving device is electrically connected with the vector network analyzer and is driven by the detection robot to move to detect a to-be-detected piece, the to-be-detected piece robot is arranged on the tray and can grab the to-be-detected piece placedin the tray for detection, and the wave-absorbing baffle plates are distributed between the detection robot and the to-be-detected piece robot. By adopting the test system, full-automatic test can becarried out on the to-be-tested piece, feeding and discharging of the to-be-tested pieces are completely and automatically controlled, manual operation is not needed, extra interference cannot be brought to the dark room environment, and the efficiency and the accuracy are improved.

A system for testing a power durability of a SAW filter includes: a signal generator for generating a continuous wave of an oscillator; a high power amplifier for amplifying a signal applied from the signal generator into a target power level; a power durability tester (PDT) for receiving the amplified signal from the high power amplifier and monitoring a power applied to a SAW filter, and setting a path for monitoring an electrical property through a network analyzer; a power meter for measuring an output signal of the PDT; a controller for changing a path to monitor an electric property of the PDT; the network analyzer for analyzing an electrical property of the SAW filter; a reliability tester for applying a test temperature to the SAW filter and maintaining the applied test temperature; a thermal meter for measuring a temperature of the SAW filter; a temperature controller for controlling a test temperature applied to the reliability tester; and a computer for controlling the signal generator, the power meter, the network analyzer, the controller, the temperature controller, and the thermal meter.

The invention relates to a plane wave generator measuring system based on a movable array antenna and applied to a base station antenna production line. The system comprises a plane wave generator based on a movable array antenna, a shielding camera obscura, a complete wave absorbing material in the camera obscura, a shielding design, an open-close type tested equipment bracket, an amplitude modulation and phase modulation network, an industrial personal computer and a vector network analyzer. A high-quality virtual plane wave dead zone is formed in an area close to the double aperture size ofthe aperture surface of the two-dimensional array antenna by controlling the position of an array antenna unit, the excitation amplitude and phase, adjusting the position of the array antenna for N (N is greater than or equal to 1) times and processing through a signal synthesis algorithm. The plane wave generator is wide in application range, can be used for directional diagram measurement of anelectrically large-size antenna and system radio frequency index measurement with the electrically large-size antenna, and is especially suitable for production line rapid measurement of a base station antenna of 5G mobile communication and measurement of a millimeter wave band terminal antenna and system.

A calibration substrate having at least one calibration standard with at least two electrical connection points, each for one measurement gate of a vector network analyzer. At least one electrical connection point is formed of at least one calibration standard having a switch, wherein the switch has a first electrical contact electrically connected to an electrical connection point of the calibration standard, a second electrical contact designed for electrically connecting to a measurement gate of the vector network analyzer, and a third electrical contact, wherein the switch is designed such that an electrical contact is established either between the first and third electrical contact or between the first and second electrical contact.

The invention discloses an active microwave sensor based on a microstrip complementary open-loop resonator structure. The active microwave sensor is used for measuring the complex dielectric constant of a dielectric material. The sensor comprises a micro-strip complementary open-loop resonator structure, an active feedback loop, a dielectric layer and a metal sheet, and the active feedback loop is a micro-strip line loop with a microwave amplifier MRF947 and can generate negative resistance to compensate loss of a resonator; and the micro-strip complementary open-loop resonator structure is composed of a pair of feeder lines and a grooved metal CSRR structure, the grooved metal CSRR structure is a square groove ring, the part between grooves is an area with the maximum electric field intensity, a to-be-measured medium sample covers the whole CSRR structure, and an S parameter curve of the sensor is measured through a vector network analyzer. The sensor has the advantages of high sensitivity, high quality factor and ultra-small electrical size, and ensures the accuracy of measurement.

The invention discloses a chip testing device. The chip testing device comprises a network analyzer and a trigger module, wherein the network analyzer, the trigger module and a chip to be tested are electrically connected; the network analyzer is configured to send a trigger instruction to the trigger module and collect the state switching time of the to-be-tested chip; the trigger module is configured to respond to the trigger instruction and send a first trigger signal to the to-be-tested chip, and the first trigger signal is a signal for triggering the to-be-tested chip to perform state switching; according to the invention, the state switching time of the chip to be tested can be acquired under the combined action of the network analyzer and the trigger module, and a complicated test environment does not need to be additionally established, so that the efficiency of acquiring the state switching time of the chip is improved, and the test cost is reduced.

The invention discloses a multi-frequency-point radio frequency impedance and current testing system. The multi-frequency-point radio frequency impedance and current testing system comprises a radio frequency multi-frequency-point testing clamp and a radio frequency current probe, wherein a gap is formed between inner cores of a top cover shell, a pressure gauge is arranged on the inner core of atop cover, a base inner core is arranged in a base shell, a radio frequency signal injection end is arranged at the end of the base inner core, the radio frequency current probe and a device to be tested are placed at the boundary between the top cover shell and the base shell, and the device to be tested is located between the inner core of the top cover and the inner core of the base; a microstrip line is arranged on the top face of a T-shaped plate and connected with a vector network analyzer and the radio frequency current probe; and the T-shaped plate is provided with a coupling coil, andthe coupling coil is electrically connected with the microstrip line and the ground plane. The multi-frequency-point radio frequency impedance and current testing system overcomes the defect that thehigher harmonic signal testing capacity is insufficient in the actual testing process, the good transmission performance of the clamp to multiple frequency points is achieved, the electromagnetic compatibility problem is solved, radio frequency current information is obtained in the testing process, and the problem that devices such as foam cannot be accurately tested due to the irreversible characteristic of compression in the testing process is solved.

The invention provides a direct current resistance and radio frequency impedance synchronous online monitoring device and method of a BGA link, the device comprises a to-be-monitored BGA sample, an impedance conversion clamp, a vector network analyzer and a direct current resistance tester, the to-be-monitored BGA sample is clamped on the impedance conversion clamp and is electrically connected with the impedance conversion clamp; the to-be-monitored BGA sample is connected with the vector network analyzer through the impedance conversion clamp, and the vector network analyzer is used for monitoring a TDR impedance signal of a radio frequency link of the to-be-monitored BGA sample; and the to-be-monitored BGA sample is connected with the direct current resistance tester through the impedance conversion clamp, and the direct current resistance tester is used for collecting a resistance signal of a DC link of the to-be-monitored BGA sample. According to the direct current resistance and radio frequency impedance synchronous on-line monitoring device and method, direct current resistance and radio frequency impedance synchronous on-line monitoring of a BGA link can be realized, the monitoring cost can be reduced, the test error can be reduced, and the test effect can be guaranteed.

The invention discloses a system and method for measuring shielding effectiveness of a nonlinear conductive material. The system is characterized in that one end of a positive electrode of a measurement clamp of the measurement system is connected with a static contact of a measurement mode change-over switch alpha, and the other end is connected with one end of a vector network analyzer; the other end of the vector network analyzer is connected with a movable contact 1 of the measurement mode change-over switch alpha; a negative electrode of the measurement clamp is connected with one end of a high-voltage alternating-current power supply and the ground, the other end of the high-voltage alternating-current power supply is connected with one end of a sampling resistor, the other end of the sampling resistor is connected with a measurement mode change-over switch beta, and the other end of the measurement mode change-over switch beta is connected with a movable contact 2 of the measurement mode change-over switch alpha; a voltmeter is connected in parallel with the two ends of the sampling resistor; and during measurement, the two ends of an object to be measured are electrically connected with the positive electrode and the negative electrode of the measurement clamp respectively. According to the method, the resistance of the object to be measured is measured by adopting a microstrip line method and/or voltammetry; and then the shielding effectiveness of the object to be measured is calculated, and the bandwidth can reach DC-40GHz.

The invention provides a dual-port electrical appliance transmission parameter acquiring method and system. An impedance parameter of a dual-port electrical appliance in a low-frequency band is obtained by means of an impedance analyzer. A scattering parameter of the appliance in a high-frequency band is obtained by means of a network analyzer. A transmission parameter of the appliance is determined according to the impedance parameter and the scattering parameter. The method and the system can obtain the impedance parameter of the low-frequency band by means of the impedance analyzer and the scattering parameter of the high-frequency band by means of the network analyzer and can determine the transmission parameter according to the impedance parameter and the scattering parameter, thereby solving the problems that during the process of obtaining electrical appliance transmission parameters, for low frequency situations, instrument test frequency may not cover the low frequency or accurate transmission parameters in low-frequency bands may not be obtained. The method and the system can obtain accurate transmission parameters of the dual-port electrical appliance in the low-frequency and high-frequency bands.

The invention discloses a coaxial connector electromagnetic shielding effectiveness testing device, solves the problem of how to reduce the difficulty of electromagnetic shielding effectiveness testing of a connector, and belongs to the technical field of electrical circuit element detection. The device comprises a connecting line, an inner circuit tube, an outer circuit tube, a matching impedor and a network analyzer; one end of the connecting line is connected with the signal output end of the signal source, the connecting line is arranged in the inner circuit tube, the other end of the connecting line is connected with a port on the same side of the inner circuit tube and one end of the coaxial connector to be tested at the same time, and the other end of the coaxial connector to be tested is connected with one end of the matching impedor; the other end of the matching impedor is connected with a measurement signal input end of the network analyzer; one port of the outer circuit tube is connected with the outer wall of the inner circuit tube, and the other port of the outer circuit tube is connected with a signal input port of the network analyzer; the matching impedance among the signal source, the inner circuit tube and the outer circuit tube is equal to characteristic impedance of the network analyzer.

The invention provides a ferrite consistency detection jig and detection method. The ferrite consistency detection jig comprises a substrate, a coil, a matching circuit and a network analyzer, the coil and the matching circuit are printed on the surface of the substrate, and the coil is electrically connected with the network analyzer through the matching circuit; the ferrite detection jig is configured to place standard ferrite on the surface of the area, printed with the coil, of the substrate, debug the matching circuit to enable the frequency range displayed by the network analyzer to be within the preset frequency range, and replace the ferrite to be detected for consistency detection. Based on the principle that corresponding electromagnetic frequency can be displayed on the network analyzer through electromagnetic induction between the coil and the ferrite, the electromagnetic frequency of the standard ferrite is enabled to be within a preset frequency range through debugging of the matching circuit, and then the ferrite to be detected is replaced for testing; and therefore, consistency of the ferrite can be confirmed by judging whether the frequency displayed on the network analyzer is within the preset frequency range or not, and a problem of how to detect consistency of the ferrite is solved.

The invention discloses a single-ended test method for the wave-absorbing characteristic of a material, which comprises a sample cavity, a microwave transmission rod, a spring needle, an SMA joint and a vector network analyzer, wherein one end of the sample cavity is provided with a test fixture; the microwave transmission rod is arranged in the sample cavity and is connected with the test fixture in a penetrating manner; the spring needle is arranged in the microwave transmission rod; the SMA joint is arranged at the other end of the sample cavity; the receiving end of the vector network analyzer is electrically connected with a coaxial cable, and the other end of the coaxial cable is electrically connected with the other end of the SMA joint. The method has the beneficial effects that the wave-absorbing characteristic of the material is tested by utilizing a single-ended method, the wave-absorbing characteristic of the material can be obtained by intuitively testing S11 through a vector network analyzer through the single-ended method, and meanwhile, test equipment does not need to be rebuilt, a darkroom does not need to be built, and arch test equipment does not need to be built; the test method can be used as another complementary test method of the bow-shaped method or the two methods for mutual verification.

The invention provides a photoelectric device frequency response test system and method. The photoelectric device frequency response test system comprises a laser light source, a broadband electro-optical modulator, a power adjusting module and a vector network analyzer. The laser light source provides a stable continuous optical signal for the broadband electro-optical modulator; the power adjusting module is used for receiving the modulated optical signal output by the broadband electro-optical modulator and outputting optical signals with different powers to the tested optical and electrical device according to the control signal of the vector network analyzer; the vector network analyzer is used for providing a microwave modulation signal and a control signal of the power adjusting module, receiving an electric output signal output by the photometric electric device and a power-regulated optical signal fed back by the power regulation module, and calculating the frequency responseof the to-be-measured optical electrical device under different power optical signals. The problem that the dynamic range of the light source module is insufficient is solved, large dynamic power adjustment can be achieved, the problem that an electro-optical modulator scans again and finds a working point when the optical power is adjusted can be avoided, and the testing efficiency is greatly improved.