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DEBUG system, method, device and medium

A technology to be observed and collected, applied in measurement devices, instruments, measuring electricity and other directions, can solve the problems of observation resources and time waste, and achieve the same effect as above and reduce the waste of resources and time.

Pending Publication Date: 2022-04-12
山东云海国创云计算装备产业创新中心有限公司
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Problems solved by technology

[0003] However, this method can only observe the chip signal step by step. If you want to observe the signal to be observed, you need to observe the pre-signal first, resulting in a waste of observation resources and time.

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  • DEBUG system, method, device and medium
  • DEBUG system, method, device and medium
  • DEBUG system, method, device and medium

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Embodiment Construction

[0043] The following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of this application.

[0044] Boundary scan test technology is a very commonly used technology for DEBUG, which is used to solve the test difficulties caused by too many pins on the chip on the printed circuit board, and is also used for the connection test problem between chips and the entire system test. Boundary scan test technology is a test method that adds a scan chain and a test access port between the boundary of the chip's internal logic and the external pin, and tests the sti...

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Abstract

The invention discloses a DEBUG system. The DEBUG system comprises a main controller and a collector. The main controller is connected with the JTAG simulator, receives access of the JTAG simulator and decodes access information so as to obtain the IP where the signal to be observed is located. And the main controller is connected with each collector through a JTAG protocol for information interaction. And each collector is connected with a to-be-observed signal in the chip to obtain data of the to-be-observed signal. And the main controller controls the corresponding target collector to acquire data of the to-be-observed signal according to the IP where the to-be-observed signal is located. By adopting the technical scheme, the to-be-observed signal is directly connected to the collector of the system, and the main controller directly controls the collector to obtain the data of the to-be-observed signal through the access of the simulator without obtaining the data of other signals, so that the waste of resources and time is reduced when the to-be-observed signal is observed. The invention further discloses a DEBUG method, a DEBUG device and a medium which correspond to the system and have the same effects.

Description

technical field [0001] The present application relates to the technical field of troubleshooting, in particular to a DEBUG system, method, device and medium. Background technique [0002] Boundary scan test technology is a very commonly used technology for troubleshooting (DEBUG), which is used to solve the test difficulties caused by too many pins on the chip on the printed circuit board, and is also used for connection testing between chips problems and testing of the entire system. Boundary scan test technology is a test method that adds a scan chain and a test access port between the boundary of the chip's internal logic and the external pin, and tests the stimulus information and transmits it serially. [0003] However, this method can only observe the chip signal step by step. If you want to observe the signal to be observed, you need to observe the pre-signal first, resulting in a waste of observation resources and time. [0004] It can be seen that how to reduce th...

Claims

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Application Information

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IPC IPC(8): G01R31/3185
Inventor 高乙文祁鹏展邵海波贾晓龙
Owner 山东云海国创云计算装备产业创新中心有限公司
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