Defect depth detection system and method based on circumferential guided waves
A defect depth and circumferential guided wave technology, applied in measuring devices, using wave/particle radiation, using sonic/ultrasonic/infrasonic waves to analyze solids, etc., can solve problems such as quantitative evaluation of difficult defects
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0023] In order to further illustrate the technical details and advantages of the present invention, it will now be described in conjunction with the accompanying drawings and embodiments.
[0024] Such as figure 1 As shown, a defect depth detection system based on circumferential guided waves is used for pipeline detection, including a host computer, a signal processing and control module, and the signal processing and control module is connected with a transducer for generating and receiving circumferential guided waves; signal The processing and control module includes a control unit, the control unit is connected to the signal generation unit and the signal processing unit, the signal generation unit is connected to the input end of the transducer, and the signal processing unit is connected to the output end of the transducer.
[0025] In this embodiment, the control unit adopts a DSP control unit, the signal generation unit is connected to the input end of the transducer...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com