Method for preparing double samples based on transmission electron microscope supporting film

A technology for transmission electron microscopy and sample preparation, which is applied in the direction of material analysis, instruments, and measuring devices using wave/particle radiation. The method is simple and easy, and the effect of improving test efficiency

Pending Publication Date: 2022-05-17
FUJIAN NORMAL UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Slots are made on the grid to separate samples, which undoubtedly increases the preparation cost of the grid
In addition, the slots on the carrier grid are very narrow, and it is difficult to assemble with the matching sample preparation table, which increases the difficulty of sample preparation
Grooving on the carrier net will also reduce the strength of the carrier net, and the carrier NetEase will shake under the action of electronic heat, which will affect the test accuracy

Method used

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  • Method for preparing double samples based on transmission electron microscope supporting film
  • Method for preparing double samples based on transmission electron microscope supporting film
  • Method for preparing double samples based on transmission electron microscope supporting film

Examples

Experimental program
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Effect test

specific Embodiment 1

[0076] The present invention is described below by simultaneously preparing and observing two samples of ceramic nano powder and carbon quantum dots on the ultra-thin carbon film support net. Proceed as follows:

[0077] (1) Put the pressure plate, ultra-thin carbon film grid and base in accordance with image 3 Assembled in the chronological position shown.

[0078] (2) Disperse the two samples of ceramic nanopowder and carbon quantum dots in a certain liquid respectively.

[0079] (3) Use a pipette gun to take 3 μL of ceramic nano-powder dispersion and drop it into the first sample preparation area 105 of the platen, and dry it with an infrared drying lamp.

[0080] (4) Use a pipette gun to take 3 μL of carbon quantum dot dispersion liquid and drop it into the second sample preparation area 106 of the platen, and use an infrared drying lamp to dry it.

[0081] (5) After both samples are prepared, if Figure 4 As shown, three small identification holes 402, 403 and 404 ar...

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Abstract

The invention provides a method for preparing double samples based on a transmission electron microscope supporting film. The double samples are prepared by matching a matched sample preparation table with a grid supporting film; when the matched sample preparation table is used for preparing double samples of the transmission electron microscope grid supporting film, the grid supporting film is placed in the base groove with the front face facing upwards, the pressing plate is matched with the base groove through the positioning column, the bottom of the pressing plate covers the grid supporting film, and the supporting film area is divided into two independent sample preparation areas through the pressing plate; after the two samples are prepared, three identification holes are formed in the supporting film at equal intervals along the circumferential edge of the first sample preparation area of the pressing plate by adopting a fine sharp object; and the two different sample preparation areas are positioned through the three identification holes. The sample preparation method is simple and easy to implement, different sample areas can be effectively positioned, and the test efficiency of the transmission electron microscope is greatly improved.

Description

technical field [0001] The invention relates to the technical fields of transmission electron microscopy, sample preparation, etc., in particular to a method for preparing double samples based on a support film for transmission electron microscopy. Background technique [0002] Transmission electron microscope is a precise and valuable instrument for analyzing the morphology, structure and composition of micro- and nano-scale samples. During TEM testing, the powder sample is usually prepared on a grid support film, dried and then sent to the electron microscope for testing. Usually only one sample can be prepared on one grid. Since the transmission electron microscope is a high-vacuum equipment, after the sample is sent in, it needs to wait for a long time for vacuuming. In addition, there is thermal drift in the initial stage after the sample is put in, and it is necessary to wait for a certain stabilization time before testing. Therefore, increasing the number of sample...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/2204G01N23/2202
CPCG01N23/2204G01N23/2202
Inventor 林惠玲
Owner FUJIAN NORMAL UNIV
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