Detection equipment and detection method for integrated circuit chip

Abstract

The invention belongs to the technical field of chip detection equipment, and particularly relates to integrated circuit chip detection equipment and a detection method.The integrated circuit chip detection equipment comprises a support, a lifting base is slidably connected to the inner side wall of the support, the lifting base is of a hollow structure, an air cylinder is installed on the support, and the output end of the air cylinder is fixedly connected with the lifting base; a pressing plate is slidably connected to the inner wall of the lifting seat, a probe is installed on the lower surface of the pressing plate, the pressing plate is connected with the inner top face of the lifting seat through a first spring, a through hole matched with the probe is formed in the bottom of the lifting seat, and a sleeve coaxial with the through hole is fixedly connected into the through hole in a penetrating mode. The probe can be well protected, dust and scraps generated in the detection process are prevented from being attached to the surface of the probe, in the continuous detection process, the surface of the probe can be cleaned through bristles, good contact between the probe and a pin is further guaranteed, and the detection effect is guaranteed.

Description

technical field [0001] The invention belongs to the technical field of chip testing equipment, and in particular relates to a testing equipment and a testing method for integrated circuit chips. Background technique [0002] Integrated circuits have the advantages of small size, light weight, less lead wires and solder joints, long life, high reliability, good performance, etc. At the same time, the cost is low, and it is convenient for mass production. In the chip production process, performance testing is an essential step. [0003] After retrieval, the national patent publication number CN113064057B discloses an integrated circuit chip testing equipment and testing method, including a base and a bracket; a placing seat is fixedly connected to the top of the base; a cylinder is connected; a fixed plate is fixed on the telescopic rod of the cylinder, and a camera is fixed at the center of the bottom end of the fixed plate; a pair of symmetrically distributed pressure rods ...

AI Technical Summary

Problems solved by technology

[0008] The purpose of the present invention is to provide a detection device and a detection method for integrated circuit chips with a good detection effect for the problem that the probe is easily covered by dust, which affects its contact with the pin, resulting in poor detection effect.

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