Detection equipment and detection method for integrated circuit chip

A technology for integrated circuit and chip detection, applied in electronic circuit testing, measuring electricity, measuring devices, etc., can solve problems such as poor detection effect, probes are easily covered by dust, etc., achieve good positioning effect, reduce cleaning difficulty, and ensure detection. effect of effect

Inactive Publication Date: 2022-05-24
深圳市通恒伟创科技有限公司
View PDF1 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] The purpose of the present invention is to provide a detection device and a detection method for integrated circuit chips with a good detection effect for the problem that the probe is easily covered by dust, which affects its contact with the pin, resulting in poor detection effect.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Detection equipment and detection method for integrated circuit chip
  • Detection equipment and detection method for integrated circuit chip
  • Detection equipment and detection method for integrated circuit chip

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] The following examples are for illustrative purposes only and are not intended to limit the scope of the invention.

[0036] like Figure 1-6 As shown, an integrated circuit chip testing device includes a bracket 1, a lift seat 2 is slidably connected to the inner side wall of the bracket 1, the lift seat 2 adopts a hollow structure, a cylinder 3 is installed on the bracket 1, and the output end of the cylinder 3 It is fixedly connected with the lift base 2, the inner wall of the lift base 2 is slidably connected with a pressure plate 4, a probe 5 is installed on the lower surface of the pressure plate 4, and the pressure plate 4 is connected with the inner top surface of the lift base 2 through the first spring 6. The lift base 2 The bottom of the bracket is provided with a through hole matching the probe 5, the through hole is fixedly connected with a sleeve 7 that is coaxial with it, a mounting plate 8 is fixedly installed in the bracket 1, and the mounting plate 8 i...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention belongs to the technical field of chip detection equipment, and particularly relates to integrated circuit chip detection equipment and a detection method.The integrated circuit chip detection equipment comprises a support, a lifting base is slidably connected to the inner side wall of the support, the lifting base is of a hollow structure, an air cylinder is installed on the support, and the output end of the air cylinder is fixedly connected with the lifting base; a pressing plate is slidably connected to the inner wall of the lifting seat, a probe is installed on the lower surface of the pressing plate, the pressing plate is connected with the inner top face of the lifting seat through a first spring, a through hole matched with the probe is formed in the bottom of the lifting seat, and a sleeve coaxial with the through hole is fixedly connected into the through hole in a penetrating mode. The probe can be well protected, dust and scraps generated in the detection process are prevented from being attached to the surface of the probe, in the continuous detection process, the surface of the probe can be cleaned through bristles, good contact between the probe and a pin is further guaranteed, and the detection effect is guaranteed.

Description

technical field [0001] The invention belongs to the technical field of chip testing equipment, and in particular relates to a testing equipment and a testing method for integrated circuit chips. Background technique [0002] Integrated circuits have the advantages of small size, light weight, less lead wires and solder joints, long life, high reliability, good performance, etc. At the same time, the cost is low, and it is convenient for mass production. In the chip production process, performance testing is an essential step. [0003] After retrieval, the national patent publication number CN113064057B discloses an integrated circuit chip testing equipment and testing method, including a base and a bracket; a placing seat is fixedly connected to the top of the base; a cylinder is connected; a fixed plate is fixed on the telescopic rod of the cylinder, and a camera is fixed at the center of the bottom end of the fixed plate; a pair of symmetrically distributed pressure rods ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R1/04
CPCG01R31/2851G01R1/04
Inventor 李晓伟李晓杰
Owner 深圳市通恒伟创科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap