Nor Flash, word line voltage anomaly detection method and control device

Abstract

The invention discloses a Nor Flash, which comprises a storage unit array, a to-be-detected voltage source; the word line voltage anomaly detection array comprises a plurality of word line voltage anomaly detection circuits, the word line voltage anomaly detection circuits are connected with word lines to be detected in a one-to-one correspondence mode, each word line voltage anomaly detection circuit comprises a test switch, a test unit and a comparison circuit, and a grid electrode of the test unit is connected with one corresponding word line to be detected through the test switch. The drain electrode of the test unit is connected with the comparison circuit, and under the condition that the test switch is switched on, the comparison circuit outputs a level signal representing a comparison result according to the current output by the drain electrode of the test unit and the reference threshold current. According to the embodiment of the invention, the built-in word line voltage anomaly detection array is used for replacing a traditional external probe to carry out voltage anomaly detection on the selected word line, so that convenience can be provided for the whole word line voltage anomaly detection, and the detection time can be reduced.

Description

technical field [0001] The present invention relates to the field of semiconductor technology, in particular to a Nor Flash, a word line voltage abnormality detection method, a control device and a computer storage medium. Background technique [0002] Nor Flash is used to store non-volatile data, which usually includes word lines that connect memory cells in parallel and bit lines that connect memory cells in series. Nor Flash usually completes the reading and rewriting functions of data through three basic functions: reading data, writing data, and erasing data. In the process of writing data and erasing data, a high voltage needs to be applied to the word line. If the voltage on the word line is abnormal, that is, the high voltage is not applied correctly, the functions of writing data and erasing data cannot be completed, and the Nor Flash cannot work normally. Therefore, it is very necessary to detect the abnormal voltage of the word line. [0003] The traditional met...

AI Technical Summary

Problems solved by technology

[0003] The traditional Nor Flash word line voltage abnormality detection method usually needs to cut the plastic protective layer outside the Nor Flash, so that the word line inside the Nor Flash is connected to the external probe, and then the voltage source to be detected is added to the word line. The voltage obtained after driving the voltage

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