Clock synchronization and trigger device for wireless distributed test system

Abstract

The invention discloses a clock synchronization and trigger device for a wireless distributed test system. The wireless distributed test system is composed of a test server, a switch, a gateway, an instrument and the clock synchronization and trigger device for the wireless distributed test system. Then the test server sends a command to the trigger device through the gateway, and the trigger device receives the command issued by the test server through the internal embedded module and then sends an instruction to the instrument or the digital logic unit so as to realize a corresponding function; specifically, each trigger device can autonomously adjust the frequency and phase of the output reference clock, so that the reference clocks of different instruments are synchronized; and the timing triggering of the plurality of instruments at the same time and the random triggering of the plurality of instruments controlled through wireless transmission are realized.

Description

technical field [0001] The invention belongs to the technical field of communication, and more specifically relates to a clock synchronization and triggering device for a wireless distributed test system. Background technique [0002] In the distributed test system, there are independent clocks in each test equipment and system. In order to ensure the real-time performance and validity of test data, it is necessary for the clocks of each equipment in the system to achieve a certain degree of synchronization. Because the clocks of each test instrument in the system will become inconsistent with the external environment, temperature drift, self-aging and other factors, mainly including phase deviation and frequency deviation, it is necessary to design a high-precision and stable clock synchronization module for each in the system. Each instrument provides consistent time information. [0003] In the prior art, the following patents introduce clock synchronization methods for ...

AI Technical Summary

Problems solved by technology

Since the distribution of test instruments in a distributed system is relatively scattered, it is inconvenient to use cables to connect and sometimes it is necessary to control multiple instruments at the same time. The limited connection ports do not meet the test requirements. It is more advantageous to realize random triggering based on wireless communication technology.

Images