Method and system for quality inspection of electronic products
A quality inspection method and technology of electronic products, applied in the direction of manufacturing computing systems, data processing applications, complex mathematical operations, etc., can solve the problems of waste of qualified electronic products, prone to failure, unqualified, etc.
Active Publication Date: 2022-08-05
NAVAL UNIV OF ENG PLA
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Problems solved by technology
[0011] Aiming at the defects of the prior art, the purpose of the present invention is to provide a method and system for exponential life-time timing testing of electronic products, aiming to solve the problem of the existing typical exponential life-time timing testing method due to the high number of unqualified products being mistaken. The probability of being judged as qualified or the higher probability of qualified products being misjudged as unqualified, resulting in the waste of qualified electronic products or the problem that electronic products are more likely to fail after they are put into use and face safety hazards
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[0119] Now it is necessary to conduct sampling inspection on a batch of electronic products whose lifespan obeys an exponential distribution by means of a timed test; it is known that the quality level of the good products concerned by the manufacturer t 0 =150 hours, producer risk threshold α=0.05; minimum quality level of concern for consumers t 1 =100 hours, the user risk threshold β=0.05; the exponential life-type timing test method for electronic products provided by the present invention is applied to calculate the test cut-off time Tw and the receiving number Ac of the timing test;
[0120] (1) Initialization parameters, α=0.05, t 0 =150, β=0.05, t 1 =100, making the risk threshold close to the range dp=0.02;
[0121] (2) Calculate the benchmark number At ;
[0122] First calculate the standard normal distribution N (0,1) alpha quantile x α , 1-beta quantile x 1-β ,have to x α =-1.6449, x 1-β =1.6449, nt =66.64; yes nt After rounding down the intege...
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The invention provides a quality detection method and system for electronic products, belonging to the field of product quality testing. The method for obtaining the test cut-off time and the number of receipts includes: using a standard normal distribution to obtain the lower limit of the search range of the number of receipts; initializing or updating both parties The fluctuation interval of the risk threshold; the gamma distribution is used to calculate the fluctuation interval of the test cut-off time of the producer and the user; by calculating the search interval of the test cut-off time, the minimum closeness of the risk threshold of both parties to the risk probability of both parties is calculated; If the probability is less than the risk threshold of both parties, the trial cut-off time and the number of acceptances are obtained. The present invention traverses to find the test cut-off time when the two risk probabilities of the test scheme are both smaller than the risk threshold, thereby reducing the probability of failure of the electronic product.
Description
technical field [0001] The invention belongs to the field of product quality testing, and more particularly, relates to a quality testing method and system for electronic products. Background technique [0002] Generally speaking, the lifespan of electronic components in normal use obey an exponential distribution, such as: printed circuit plug-ins, electronic components, resistors, capacitors and integrated circuits. In addition, when a product consists of many parts, no matter what the distribution of the life of these parts is, as long as any part of the product fails and is repaired and put into use, after a long period of time, the life of the product can theoretically be regarded as obeying index distribution. [0003] Exponential life type timing test is a sampling inspection method for products whose lifespan obeys exponential distribution. The common test mode is: randomly select from a batch of electronic products n A reliability life test is carried out for each...
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IPC IPC(8): G06Q10/06G06F17/18G06Q50/04
CPCG06Q10/06395G06Q10/0635G06F17/18G06Q50/04Y02P90/30
Inventor 胡俊波罗忠李华阮旻智邵松世钱超
Owner NAVAL UNIV OF ENG PLA