Bicrystal ultrasonic probe and automatic sensitivity detection method of flaw detection system thereof

Abstract

The invention discloses a bicrystal ultrasonic probe and an automatic sensitivity detection method of a flaw detection system of the bicrystal ultrasonic probe. The automatic sensitivity detection method does not need to use a standard test block; the emitting electrode and the echo electrode of the bicrystal ultrasonic probe emit and receive interface waves independently, the wafer of the emitting electrode or the echo electrode generates ultrasonic waves, the end face of the bicrystal ultrasonic probe emits the ultrasonic waves to form the interface waves, and the interface waves are received by the wafer generating the ultrasonic waves; or the emitting electrode and the echo electrode of the bicrystal ultrasonic probe are connected in parallel to form an emitting echo electrode; the wafer of the transmitting echo pole generates ultrasonic waves, the end face of the twin-crystal ultrasonic probe transmits the ultrasonic waves to form interface waves, and the interface waves are received by the wafer of the transmitting echo pole. According to the invention, the sensitivity of the twin-crystal ultrasonic probe and the flaw detection system thereof can be rapidly and automatically detected in a short time without a standard test block.

Description

technical field [0001] The invention belongs to the field of ultrasonic non-destructive testing, in particular to a dual-crystal ultrasonic probe (also called an ultrasonic transducer) and an automatic detection method for the sensitivity of a flaw detection system. Background technique [0002] The sensitivity of the existing traditional dual-element ultrasonic probes requires the use of standard test blocks for sensitivity measurement (such as figure 2 ), this method is suitable for the sensitivity detection of a small number of dual-crystal ultrasonic probes in the room, and there are ready-made and mature standards and methods: the dual-crystal ultrasonic probe works in the one-transmit-one-receive mode, and the right transmitting chip emits ultrasonic waves through the wedge. When the test block reaches the artificial standard defect position, the ultrasonic reflection is transmitted to the left receiving wafer, and the defect of the artificial standard test block can b...

AI Technical Summary

Problems solved by technology

The pass-through flaw detection system has a large number of ultrasonic probes (hundreds or even more). If the above-mentioned traditional methods are used for the sensitivity detection of ultrasonic and flaw detection systems, the detection time will take a long time, and a limited skylight time needs to be applied for on-line detection.

[0004] Therefore, in this case, a fast, online-free, automatic detection method for dual-element ultrasonic probes and their flaw detection system sensitivity is needed to solve the daily use problems of the current pass-through flaw detection system.

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