Abnormality test control circuit used in high-power power supply solution circuit

Abstract

The invention provides an abnormity test control circuit for a high-power power supply solving circuit, which comprises a filtering module and a control module, and is characterized in that the control module comprises resistors R3, R6, R8 and R10, a capacitor C6, a controllable precision voltage source Q2, a voltage-regulator tube D6 and a triode Q3; one end of the R6 is connected with the first end of the filtering module and the third pin of the Q2, and the other end of the R6 is connected with one end of the R10 and the first pin of the Q2; the other end of the R10 is connected with the second end of the filtering module; the R3 is connected between the third pin and the second pin of the Q2; one end of the R8 is connected with the second pin of the Q2 and the first pin of the Q3, and the other end of the R8 is connected with the second pin of the Q3 and the negative electrode of the D6; the positive electrode of the D6 is connected with the second end of the filtering module and is grounded at the same time; and the positive electrode of the C6 is electrically connected with the third pin of the Q3, and the negative electrode of the C6 is grounded. The circuit provided by the invention ensures that the output current always works in a set range, and can avoid sudden change.

Description

technical field [0001] The application relates to the field of high-power power supply circuits, and in particular to an abnormal test control circuit used in high-power power supply solution circuits. Background technique [0002] The power of the existing LED whole lamp exceeding 100W needs to meet the LVLE test standard, that is, the output of each driver independently meets the LVLE test of less than 100W output power. Therefore, the power supply exceeding 100W needs to be assembled using two or more independent drivers, which makes the circuit structure very complicated and the driver occupies a large space. In addition, under the LVLE abnormal test standard, in the entire load range, the output current cannot change abruptly (beyond the set range), and the existing high-power power supply circuit cannot cope with the sudden change of the output current, so it may fail to pass The case for LVLE testing. [0003] In view of this, it is particularly important to provide...

AI Technical Summary

Problems solved by technology

Therefore, a power supply exceeding 100W needs to be combined with two or more independent drivers, which makes the circuit structure very complicated and the driver takes up a lot of space

In addition, under the LVLE abnormal test standard, within the entire load range, the output current cannot change suddenly (beyond the set range), and the existing high-power power supply circuit cannot cope with the sudden change in the output current, so it may fail to pass The Case for LVLE Testing

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