Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Classifier model training method and device for detecting chromosome structure abnormality

A technology for model training and chromosomes, applied in the fields of instrument, character and pattern recognition, and computing, which can solve the problems of insufficient types and quantities of abnormal chromosomes, high cost and difficulty, and inability to support the construction of complex deep recognition models.

Active Publication Date: 2022-08-02
HANGZHOU DIAGENS BIOTECH CO LTD
View PDF16 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] In order to solve the problem in the prior art, if it is necessary to automatically screen abnormal chromosome structure detection methods with the help of deep learning algorithms, it is necessary to train a classifier model that can accurately classify normal and abnormal structural chromosomes. The number is not abundant and the high cost and difficulty of obtaining, only using a small number of existing chromosomes with real structural abnormalities, cannot support the construction of complex deep recognition models. The present invention provides a classifier model training method for detecting abnormal chromosome structures and device

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Classifier model training method and device for detecting chromosome structure abnormality
  • Classifier model training method and device for detecting chromosome structure abnormality
  • Classifier model training method and device for detecting chromosome structure abnormality

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments. Note that the aspects described below in conjunction with the accompanying drawings and specific embodiments are only exemplary, and should not be construed as any limitation to the protection scope of the present invention.

[0036] The following description is presented to enable any person skilled in the art to make and use the invention and to integrate it into a specific application context. Various modifications, and various uses in different applications will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to a wider range of embodiments. Thus, the present invention is not limited to the embodiments set forth herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

[0037] In the following detailed description, numerous spe...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a classifier model training method and device for detecting chromosome structure abnormality. The training method comprises the steps that real normal chromosomes are obtained, a first difference matrix between real normal homologous chromosome pairs is obtained, and two homologous chromosomes in the real normal homologous chromosome pairs are both real normal chromosomes; artificial defect chromosomes are constructed based on the real normal chromosomes, a second difference matrix between the artificial defect homologous chromosome pairs is obtained, and at least one of two homologous chromosomes in the artificial defect homologous chromosome pairs is an artificial defect chromosome; training at least by taking the first difference matrix and the second difference matrix as samples to obtain a classifier model for detecting the chromosome structure abnormality; and judging whether the to-be-diagnosed user has chromosome abnormality based on the classifier model. According to the method, abundant structure abnormal chromosomes of different types are artificially constructed, so that sufficient and balanced samples are provided for classifier model training.

Description

technical field [0001] The present invention relates to the detection of chromosome structural abnormalities, in particular to a classifier model training method and device for detecting chromosome structural abnormalities. Background technique [0002] Chromosomal abnormalities, including deletions, duplications or irregularities of chromosomal DNA, are the underlying cause of various genetic diseases. About 0.6% of live births have chromosomal abnormalities, which often lead to deformities and / or developmental disabilities. Diseases caused by chromosomal abnormalities can have serious consequences, such as 25% of miscarriages and stillbirths due to chromosomal abnormalities, and 50% to 60% of miscarriages in the first trimester. With the help of chromosomal abnormality detection, clinicians can identify all abnormalities that may lead to birth defects. According to the general understanding of chromosomal abnormalities, they can be roughly divided into two types: quantit...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/62
CPCG06F18/22G06F18/241G06F18/214
Inventor 宋宁韦然晏青吕明马伟旗贾瑞
Owner HANGZHOU DIAGENS BIOTECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products