Unlock instant, AI-driven research and patent intelligence for your innovation.

Mechanism for fixing scattering target, and electron self-rotating analyzer

A technology of fixing mechanism and scattering target, applied in material analysis using radiation diffraction, particle separation tube, circuit, etc., can solve the problems of difficult to replace scattering target, unable to ensure quantitative measurement, etc.

Inactive Publication Date: 2004-07-28
HOKKAIDO UNIVERSITY
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the conventional technique is not easy to replace the scattering target, so that in the above-mentioned conventional analyzer, high quantitative determination cannot be ensured.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Mechanism for fixing scattering target, and electron self-rotating analyzer
  • Mechanism for fixing scattering target, and electron self-rotating analyzer
  • Mechanism for fixing scattering target, and electron self-rotating analyzer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.

[0014] figure 1 An embodiment of an electron spin analyzer according to the invention is schematically shown, which has a scattering target according to the invention.

[0015] figure 1 The electron spin analyzer shown in has an electron beam generating device 1, opposite to the electron beam exit hole 1A of the electron beam generating device 1, a hemispherical accelerating electrode composed of an outer electrode 2-1 and an inner electrode 2-2, the electrode The support 3, a pair of scattered electron detectors 4-1 and 4-2 located on the outer surface of the outer electrode 2-1 constituting the accelerating electrode, and the scattered electron detectors formed in the openings of the electrode support 3 in the accelerating electrode Target 5.

[0016] The scattering target 5 is supported by the scattering target holder 6 from the outside of the space formed...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A scattering target constituting an electron spin analyzer is supported by a scattering target-holding member made of a conductive material from the outside of the space formed by an accelerating electrode and an electrode supporter. Then, the scattering target-holding member is supported in insulation by an insulation supporting member made of an insulating material. Moreover, a guiding member is provided so as to cover the periphery of the insulation supporting member for guiding the scattering target, the scattering target-holding member and the insulation supporting member.

Description

technical field [0001] The present invention relates to scattering target fixing mechanisms and electron spin analyzers, and more particularly, the present invention relates to scattering target fixing preferably for high efficiency electron spin analyzers such as electronic material analyzers and magnetic material surface analyzers Bodies and Electron Spin Analyzers. Background technique [0002] In the case of a small electron spin analyzer that performs spin analysis of electrons accelerated by 20-60Kev, it is not easy to replace the scattering target due to the small space inside the analyzer. Thus, in the conventional electron spin analyzer described above, the scattering target cannot be replaced without disassembling the analyzer apparatus main body including the vacuum chamber and taking out the analyzer. [0003] On the other hand, the analytical performance of electron spin analyzers depends on the thickness of the scattering target. For calculations of quantitat...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/20G01T1/32H01J37/20H01J37/28H01J37/295
CPCH01J37/295H01J37/20H01J49/00
Inventor 武笠幸一池田正幸末岡和久武藤征一上远野久夫上田映介
Owner HOKKAIDO UNIVERSITY