Semiconductor buffer capacity regulating method, electronic system and semiconductor device

Abstract

The present invention is to configure ROM (5) in the memory module (2) for memorizing the characteristic distribution information with values representing the characteristic distribution for each semiconductor memory (1a to 1d). The characteristic distribution information is the data measured in the stage of manufacturing semiconductor device, for example. The BIOS (3) can read the characteristic distribution information memorized in ROM (5) during initialization, and obtain the optimized value of buffer capacity for each semiconductor memory based on the characteristic distribution information, and conduct the configuration process for suitably adjusting the buffer capacity for each semiconductor memory by the memory controller (4) through the local bus. The memory controller (4) can suitably adjust the signal for the signal intensity of buffer capacity for each semiconductor memory according to the contents configured by the BIOS (3), so as to supply it to the memory module (2).

Description

technical field [0001] The invention relates to a semiconductor buffer capacity adjustment method for adjusting the semiconductor buffer capacity, an electronic system and a semiconductor device. Background technique [0002] In recent years, various semiconductor devices have been developed and manufactured according to their applications. Among the semiconductor devices, there are various types of semiconductor devices in which a single semiconductor memory is used connected to a memory controller and the semiconductor memory is mounted on a plurality of substrates and modularized. [0003] In order to ensure stable signal quality over a certain amount, semiconductor devices must be designed and manufactured to have moderate buffering capabilities. [0004] For example, when a large load is applied, the parasitic input capacitance increases, and the buffer capacity must be increased because the rising edge of the semiconductor input signal waveform is gentle. On the othe...

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Problems solved by technology

In addition, there is a difference in impedance on the printed substrate that transmits semiconductor signals

[0008] When this difference in characteristics exceeds the limit, the buffer capability of the semiconductor device fluctuates and the quality of the signal waveform deteriorates

This leads to misoperation of semiconductor devices or element destruction

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