Space correction method for 2D seisimc overlapping shift profile drawing
A profile and mapping technology, applied in seismology, seismic signal processing, geophysical surveying, etc., can solve problems such as low mapping accuracy, low work efficiency, and high labor intensity
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Embodiment 1
[0072] figure 2 Shifang 148 well area T 2 The depth value is projected onto the scatter diagram on the survey network after the blank calibration method of the two-dimensional seismic stack offset profile mapping method. "+" in the figure indicates the CDP point, and "°" indicates the breakpoint; , each CDP point has reached the real reflection point position underground after empty calibration; image 3 so figure 2 It is based on the depth structure map automatically generated after homing both the main survey line and the contact side line on the computer by this method. It takes less than 5 minutes to complete on the computer, but it takes several days to complete it by hand, which greatly improves the work efficiency and improves the accuracy of the structural diagram.
Embodiment 2
[0074] Figure 4 It is Songliao Xujiaweizi T 4 Layer t 0 scatterplot; Figure 5 It's Xujiaweizi T 4 The depth scatter diagram obtained after the layer is blank-calibrated by this method, "+" in the figure indicates the CDP point, and "°" indicates the break point. From Figure 4 and Figure 5 can be found in Figure 5 The empty calibration direction of each CDP point is homing along the updip direction of the formation. According to the migration principle, after homing, each CDP point has reached the real reflection point position underground.
[0075] It can be seen that the 2D seismic stack deflection section drawing blank correction method uses the data of the main survey line and the contact survey line to make the structural map at the same time, without loss of data points; the true depth structural map is drawn, and the structural shape is real. The position of the high point is accurate; using computer automatic empty calibration, the labor intensity of the int...
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