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Nanometer-particle microscope

A nanoparticle and microscope technology, which is applied in the field of microscopy and microscopy, can solve problems such as statistics and classification.

Inactive Publication Date: 2004-11-17
上海爱建纳米科技发展有限公司
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  • Summary
  • Abstract
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  • Application Information

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Problems solved by technology

[0002] One of the traditional microscopes is a microscope composed of light diffraction statistics, which can only obtain the statistical characteristics of particles
There is also a microscope formed by perspective, which can only obtain the perspective characteristics of particles
The above two microscopes cannot achieve the purpose of not only observing the shape and morphology of nanoparticles, but also performing statistics and grading of nanoparticles

Method used

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Embodiment Construction

[0016] The structure of the microscope of the present invention is further described below with reference to the accompanying drawings.

[0017] figure 1 It is the overall structure of the microscope of the present invention. It mainly includes a host 1, a main controller 2 connected to the host 1, and a probe 3 connected to the main controller. A display 5 is connected to the host 1 . The host 1 , the main controller 2 and the display 5 are powered by the main power source 4 .

[0018] The data and topographic images of the particles detected by the probe 3 are transmitted to the host 1 via the host controller 2 . The host 1 processes, analyzes and counts the data and the topography images, and finally displays the topography images of the measured particles on the display 5, and provides statistical data of the measured particles, etc.

[0019] figure 2 It is the specific structure of the probe 2 in the microscope of the present invention. Depend on figure 2 As sho...

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Abstract

The invention is a kind of nano particle microscope, which mainly includes a host machine, a primary controller and detector. The information of particles acquired by the probe of the detector is transmitted to the host machine after preprocessed by the preprocessor in the detector. After passing through the figure diagram processing model, figure diagram analysis model, particle statistic model and observation and displaying model, the figure of the particle can be displayed on the screen. It can acquire accurate statistic data. Thus, the invention has functions observing particle's figure diagram and statistic particle data. The resolution can reach nano grade, the measuring precision is less than 0.5 nano.

Description

technical field [0001] The present invention relates to a microscope, in particular to a nanoparticle microscope. Background technique [0002] One of the traditional microscopes is a microscope constructed by means of light diffraction statistics, which can only obtain the statistical characteristics of particles. There is also a microscope constructed by means of perspective, which can only obtain the perspective characteristics of particles. The above two microscopes cannot achieve the purpose of not only observing the shape and morphology of nanoparticles but also performing statistics and classification of nanoparticles. SUMMARY OF THE INVENTION [0003] In order to overcome the above-mentioned problems in the prior art, the present invention provides a nanoparticle microscope, which can not only observe the morphological characteristics of the nanoparticle, but also obtain its statistical data. The resolution can reach the observation of DNA, that is, the resolutio...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01Q60/24
Inventor 李荣庆林学海
Owner 上海爱建纳米科技发展有限公司