Semiconductor device with memory and method for memory test

Abstract

A semiconductor device is disclosed which includes a data memory which stores data and a code memory which stores an ECC code corresponding to the data. The semiconductor device includes an ECC unit which outputs, to the data memory as the data, a test pattern required to test the data memory, and which generates, from the test pattern, code information having an error checking function, and outputs the code information to the code memory as the ECC code.

Description

[0001] This application is based on and claims priority from Japanese Patent Application No. 2004-36077 filed on February 13, 2004, the entire contents of which are hereby incorporated by reference. technical field [0002] The present invention relates to common semiconductor devices, and in particular to a semiconductor device including a memory and a memory testing method for testing the memory. Background technique [0003] In general, among semiconductor memory devices, there is an ECC circuit built-in semiconductor device including an error correction circuit (ECC circuit: error checking and correcting circuit). In such semiconductor memory devices with built-in ECC circuits, two types of memories are mounted: a data memory for storing data and a code memory for storing ECC codes (see, for example, USP.6295617). [0004] In such a semiconductor memory device, there is a memory test method in which a memory is tested using a built-in test circuit and an ECC circuit (see...

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Problems solved by technology

Therefore, it becomes the main cause of increased test cost