Method for adjusting a lamp relative to an illuminating beam path of a microscope and a microscope suitable for carrying out the method
a technology of illuminating beam and lamp, which is applied in the direction of microscopes, optics, instruments, etc., can solve the problems of inability to make lamp adjustment in accordance with classical adjustment criteria, and the complexity of microscopes which cannot be realized, especially for routine users of microscopes
Inactive Publication Date: 2005-06-02
CARL ZEISS SEMICON MFG
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Benefits of technology
Ensures homogeneous illumination and facilitates automated lamp adjustment, making it easier for both experienced and inexperienced operators, and can be implemented in existing microscopes with motorized drives and a control system.
Problems solved by technology
Because of the complexity of these classical methods for lamp adjustment, these methods are suited only to a limited extent to an automatization (in the first assembly and also after an exchange of lamps) in such a manner that the microscope ensures a homogeneous illumination of the object field without manual intervention.
On the other hand, experience has shown that especially routine users of microscopes are often unable to make a lamp adjustment in accordance with classical adjustment criteria.
The use of such beam homogenizers would, however, lead to a complexity in microscopes which could not be realized.
Method used
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[0021] In FIG. 1, the upper part of the microscope stand with the illuminating beam path accommodated therein is identified by reference numeral 1. A specimen table 2 adjustable in elevation for focusing is accommodated on the microscope in a manner known per se. Furthermore, the microscope includes a lens turret 3 containing objectives 4 of which only one is shown in FIG. 1.
[0022] The reflecting illuminating beam path in the microscope of FIG. 1 includes, in principle, the components which are usual for the adjustment of the Köhler illuminating conditions. A halogen lamp or a gas discharge lamp 5 can be provided as a light source. The light, which is emitted by the lamp 5, is collimated by a collector lens 9 and, if required, is collimated in combination with a collector mirror 17 which collects the backward radiated light and reflects it back into the lamp 5. A field diaphragm10 is provided in the region of the collimated beam path and is adjustable with respect to its aperture d...
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The invention relates to a method for automatic lamp adjustment in a microscope without beam homogenizers in the illuminating beam path and a microscope equipped for the application of the method. According to the invention, the light power in the illuminating beam path is integrally measured with a detector behind the pupil plane of the microscope objective or behind the pupil plane of the illuminating beam path and the lamp is so adjusted relative to the illuminating beam path that the light power, which is detected by the detector, is a maximum. In a microscope, which is suitable for an automated lamp adjustment, for example, after an exchange of the lamp according to the method of the invention, motorized drives are provided for adjusting the lamp. These drives are driven sequentially by an evaluation and control computer until a maximum light power is detected with a detector.
Description
FIELD OF THE INVENTION [0001] The invention relates to a method for adjusting a lamp relative to an illuminating beam path of a microscope without a beam homogenizer and a microscope suitable for carrying out the method. BACKGROUND OF THE INVENTION [0002] The adjustment of lamps for microscope illumination takes place usually in accordance with classical adjustment criteria which ensure a homogeneous illumination of the object field. This applies to the first adjustment of a microscope as well as to an exchange of a lamp. A first adjustment criterion is a sharp imaging of the light source, that is, of the light arc or of the lamp filament into the pupil of the objective. This adjustment criterion can be checked with the aid of a so-called Bertrand lens which images the objective pupil in the viewing field of the microscope. In lieu of a visual control of the sharp imaging, a CCD camera can be mounted in the image plane of the Bertrand lens and the image of the CCD camera is evaluate...
Claims
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IPC IPC(8): G02B21/06G02B21/08
CPCG02B21/082G02B21/06
Inventor OTT, PETER
Owner CARL ZEISS SEMICON MFG