11 results about "Beam homogenizer" patented technology

The invention belongs to the technical field of nondestructive testing, and particularly relates to a delayed sampling infrared nondestructive testing method and system based on a uniform light field. The invention provides a delayed sampling infrared nondestructive testing method and system based on a uniform light field in order to solve the problems of an active infrared nondestructive testing method in the aspects of light beam uniformity, defect contrast, reflected light interference and the like. The delay sampling infrared nondestructive testing method based on the uniform light field comprises the following steps that 1, synchronous square wave signals and continuous pulse wave signals are generated, and the continuous pulse wave signals are delayed from the square wave signals; 2, the square wave signal controls a laser 3 to alternately change between a light emitting state and a light extinguishing state through periodic switching of high and low levels; and step 3, energy emitted by the laser 3 is in near Gaussian distribution, and non-uniform laser is transmitted to the light beam homogenizer 5 through the optical fiber 4.

An LED light engine includes a plurality of LED emitters; a first lens array having a plurality of collimating lenslets corresponding to the plurality of LED emitters, where the first lens array is optically coupled to the plurality of LED emitters and configured to emit a plurality of light beams corresponding to the plurality of LED emitters, each of the light beams including partially collimated light rays; a light integrator optic to receive the plurality of light beams and to internally reflect the light beams to generate a plurality of at least partially-homogenized light beams; a homogenizer optically coupled to the light integrator optic and configured to receive the plurality of at least partially-homogenized light beams from the light integrator optic; and a converging lens optically coupled to the homogenizer. The homogenizer and the converging lens illuminate a gate with the plurality of light beams from the light integrator optic.

A method of making a semiconductor device involves the steps of disposing a first semiconductor die over a substrate and disposing a beam homogenizer over the first semiconductor die. A beam from the beam homogenizer impacts the first semiconductor die. The method further includes the steps of determining a positional offset of the beam relative to the first semiconductor die in a number of pixels, using a first calibration equation to convert the number of pixels into a distance in millimeters, and moving the beam homogenizer the distance in millimeters to align the beam and first semiconductor die.

A laser lift-off apparatus and a substrate lift-off method using the same are provided. The laser lift-off device is configured to convert a first light beam into a second light beam having a width in a first direction and in a second direction different from the first direction, the laser lift-off device comprising: a laser beam generator configured to generate the first light beam; a homogenizer configured to homogenize the first light beam; and a beam cutter including a first beam cutter and a second beam cutter defining at least two openings having different respective lengths in the first direction and configured to generate a second beam by transmitting and blocking respective portions of the first beam.

A laser light source (2) and a laser projection device (100), which relate to the technical field of display. The laser projection device (100) comprises the laser light source (2), which comprises a beam homogenizer (22) and a driving module (24), wherein the beam homogenizer (22) comprises at least one coil (220) and a beam homogenizing element (231); the driving module (24) is connected to the at least one coil (220) and is configured to send an energization signal to the at least one coil (220), so that the at least one coil (220) is energized; and the beam homogenizing element (231) moves along a circular or elliptical trajectory under a magnetic force generated after the at least one coil (220) is energized, so that the beam homogenizing element (231) can achieve better beam homogenization and speckle reduction effects.

The inventions provide microscopes for imaging samples within wells of multi-well plates. Microscopes of the disclosure include a beam homogenizer system that shapes a beam from a light source into a shape specific to the bottom of a well of a multi-well plate. In particular, microscopes of the disclosure can illuminate wells for imaging by passing light through a prism that is beneath the sample. The light enters the prism from the side and as refracted into the well at a steep angle such that the light only illuminates about a bottom ten microns of the well. The beam homogenizer shapes the light from the light source so that, instead of hitting the prism as a spot with an irregular shape, the light enters the prism in a substantially rectangular pattern with homogeneous optical power level over the pattern.

The application discloses a super-short symmetrical bending type beam homogenization transmission line, which is a symmetrical bending type strong current homogenization beam line containing two pieces of four-eight level composite iron and one piece of shared two level iron; the symmetrical bending type strong current homogenization beam line is composed of one shared beam line and two branch beam lines; the shared beam line is provided with an accelerator exit, a beam matching mechanism, four-eight level composite iron 1 and two level iron along the beam direction; the first branch beam line is sequentially provided with four-eight level composite iron 2, a beam matching and homogenization effect observation mechanism 1 and a terminal 1; the second branch beam line is sequentially provided with four-eight level composite iron 3, a beam matching and homogenization effect observation mechanism 2 and a terminal 2; the four-eight level composite iron of the beam line can simultaneously realize the focusing and homogenization of the beam envelope, the composite iron installed on the beam transmission line can reduce the number of transmission elements, shorten the length of the transmission line and reduce the engineering cost of the beam transmission line.

An apparatus for manufacturing a display device includes a laser emission unit including a first laser unit emitting a first laser beam and a second laser unit emitting a second laser beam, and a homogenizer which homogenizes the first laser beam and the second laser beam. The homogenizer includes a homogenizing lens unit including a plurality of homogenizing lenses which separate each of the first laser beam and the second laser beam into a plurality of laser beams and generate overlapping laser beams by overlapping the plurality of laser beams obtained by separating each of the first laser beam and the second laser beam with each other, and a condenser lens unit which condenses the overlapping laser beams, the plurality of homogenizing lenses being arranged in a curved shape.

The inventions provide microscopes for imaging samples within wells of multi-well plates. Microscopes of the disclosure include a beam homogenizer system that shapes a beam from a light source into a shape specific to the bottom of a well of a multi-well plate. In particular, microscopes of the disclosure can illuminate wells for imaging by passing light through a prism that is beneath the sample. The light enters the prism from the side and as refracted into the well at a steep angle such that the light only illuminates about a bottom ten microns of the well. The beam homogenizer shapes the light from the light source so that, instead of hitting the prism as a spot with an irregular shape, the light enters the prism in a substantially rectangular pattern with homogeneous optical power level over the pattern.

A metalenslet beam homogenizer offers an alternative to classical beam homogenization techniques by leveraging flat optical metasurfaces. The metalenslet beam homogenizer would be beneficial, for example, for high power laser applications, such as laser material processing, digital projection, optical lithography, and additive manufacturing in which it is necessary to expose a certain area on a workpiece to a well-defined amount of optical radiation. The metalenslet beam homogenizer provides benefits by enhancing the beam homogenization quality, reducing size and complexity, and lowering optical power loss. It does so by using nanophotonic metasurface lenses and offers higher homogenization quality by mitigating the impact of diffraction and reducing the size of the optical system by combining the functionality of multiple optical elements into fewer devices. Overall, the metalenslet beam homogenizer represents a significant improvement over conventional beam homogenizers, offering a more efficient, more compact, and more reliable way to produce high-quality beam uniformity.

A power receiver includes a beam homogenizer that takes portions of a power beam and spreads them to each cover a substantial fraction (or all) of a power converter surface. The beam homogenizer may lack reflective side walls, and may have an aspect ratio as low as 2-5. The normalized deviation of beam irradiance at the surface may be reduced by a factor of 2-5 or more.