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Linear array detector system and inspection method

a detector system and detector technology, applied in the field of imaging systems, can solve problems such as limited flexibility of arrays

Inactive Publication Date: 2006-03-30
GENERAL ELECTRIC CO
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  • Application Information

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Benefits of technology

"The patent describes a detector for scanning objects using X-rays. The detector has a scintillator layer that generates optical signals when hit by X-rays, and a two-dimensional array of photo-conversion elements that convert the optical signals into electrical signals. The detector can determine the geometry of the X-ray paths that pass through the object, and the energy deposition profile of each segment of the X-ray paths. This information can be used to create an image of the object. The technical effect of this invention is to provide a more accurate and precise method for inspecting objects using X-rays."

Problems solved by technology

Typically such arrays have limited flexibility as the detectors generally involve fixed geometry configurations.
However, a conventional inspection image data set, produced with a single source spectrum and an energy-integrating detector, permits only the extraction of information on material density.

Method used

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  • Linear array detector system and inspection method

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Embodiment Construction

[0022]FIG. 2 is a block diagram of an embodiment of a system 10, which is an X-ray system designed both to acquire original image data and to process the image data for display and analysis in accordance with the present technique. Other imaging systems such as computed tomography system and digital radiography systems, which acquire image three dimensional data for a volume, also benefit from the present techniques. The following discussion of X-ray system 10 is merely an example of one such implementation and is not intended to be limiting in terms of modality.

[0023] As used herein, “adapted to”, “configured” and the like refer to devices in a system to allow the elements of the system to cooperate to provide a described effect; these terms also refer to operation capabilities of electrical or optical elements such as analog or digital computers or application specific devices (such as an application specific integrated circuit (ASIC)), amplifiers or the like that are programmed ...

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Abstract

A linear array detector (LAD) for scanning an object is provided. The detector includes a scintillator layer configured for generating a number of optical signals representative of a fraction of an incident X-ray beam passing through the object. The plane of the scintillator is parallel to the X-ray beam. The LAD further includes a two dimensional array of photo-conversion elements configured to receive several X-rays of the X-ray beams and configured to generate corresponding electrical signals. An arrangement of the photo-conversion elements is independent of the X-ray paths.

Description

BACKGROUND [0001] The invention relates generally to imaging systems and more specifically to a method and system for acquiring images. [0002] Many industrial inspection systems require very high detection efficiency, excellent signal-to-noise performance and coverage. In addition, it is desired that the overall cost of the industrial system is reasonable. [0003] Linear detection arrays may be used for various low energy and high-energy x-ray inspection applications. Such detector arrays receive X-rays emitted by a source and passing through an object that is required to be scanned. Typically such arrays have limited flexibility as the detectors generally involve fixed geometry configurations. [0004] Typically, such detectors include a scintillator layer and a photoconversion device. The photoconversion device has many photosensor elements. The photosensor elements are arranged based on one or more pre-determined paths that the X-rays follow. FIG. 1 is a block diagram of a conventio...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): H05G1/64
CPCG01T1/2018G01T1/20185
Inventor HOPKINS, FORREST FRANKGALISH, ANDREW JOSEPHROSS, WILLIAM ROBERT
Owner GENERAL ELECTRIC CO
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