Linear array detector system and inspection method
Patent Information
- Authority / Receiving Office
- US · United States
- Patent Type
- Applications(United States)
- Current Assignee / Owner
- GENERAL ELECTRIC CO
- Publication Date
- 2006-03-30
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
BACKGROUND
[0001] The invention relates generally to imaging systems and more specifically to a method and system for acquiring images.
[0002] Many industrial inspection systems require very high detection efficiency, excellent signal-to-noise performance and coverage. In addition, it is desired that the overall cost of the industrial system is reasonable.
[0003] Linear detection arrays may be used for various low energy and high-energy x-ray inspection applications. Such detector arrays receive X-rays emitted by a source and passing through an object that is required to be scanned. Typically such arrays have limited flexibility as the detectors generally involve fixed geometry configurations.
[0004] Typically, such detectors include a scintillator layer and a photoconversion device. The photoconversion device has many photosensor elements. The photosensor elements are arranged based on one or more pre-determined paths that the X-rays follow. FIG. 1 is a block diagram of a conventio...