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Apparatus and method for testing an IEEE1394 port

a technology of motherboard and test device, applied in the field of apparatus, can solve the problems of increasing the cost of testing, consuming significant amounts of power for the hard disk drive, and high cost of the ata/atapi hard disk driv

Inactive Publication Date: 2007-04-26
HON HAI PRECISION IND CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0008] Other advantages and novel features will become more apparent from the following detailed description, in which:

Problems solved by technology

However, a conventional ATA / ATAPI hard disk drive is expensive, and this can increase the cost of testing.
Furthermore, the ATA / ATAPI hard disk drive consumes significant amounts of power, and is prone to cause reliability problems especially if it sustains external shock or vibration.
If the ATA / ATAPI hard disk drive operates unreliably, this may compromise the accuracy of the test.

Method used

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  • Apparatus and method for testing an IEEE1394 port

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Embodiment Construction

[0011] Referring to FIG. 1, an apparatus 100 for testing an IEEE1394 port of a motherboard test apparatus 60 in accordance with a preferred embodiment of the present invention includes an IEEE1394 connector 50, a cable transceiver arbiter 10, a first converting chip 20, a second converting chip 30, and a flash chip 40 used as a signal recorder, all of which are electrically connected in sequence. The IEEE1394 connector 50 is an IEEE1394a connector, an IEEE1394b connector, or both. The cable transceiver arbiter 10 is used for receiving IEEE1394 signals from the IEEE1394 connector 50 or outputting the IEEE1394 signals to the IEEE1394 connector 50. The first converting chip 20 is used for converting the IEEE1394 signals to integrated drive electronics (IDE) signals. The second converting chip 30 is used for converting the IDE signals to flash signals, and the flash signals are stored in the flash chip 40. The apparatus 100 exemplarily comprises a circuit substrate so that all of the IE...

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Abstract

An apparatus for testing an IEEE1394 port of a motherboard test device includes an IEEE1394 connector, a cable transceiver arbiter connected to the IEEE1394 connector, a first converting chip connected to the cable transceiver arbiter, a second converting chip connected to the first converting chip, and a flash chip connected to the second converting chip. The controller receives IEEE1394 signals from the connector, the first converting chip and second converting chip cooperate to convert the IEEE1394 signals to flash signals, the flash signals are stored in the flash chip. The first converting chip and the second converting chip also cooperate to convert the flash signals to the IEEE1394 signals, the connector outputs the IEEE1394 signals through the controller. A method for testing an IEEE1394 port of a motherboard test device is also provided.

Description

BACKGROUND OF THE INVENTION [0001] 1. Field of the Invention [0002] The present invention relates to an apparatus, and particularly to an apparatus and a method for testing an IEEE1394 port of a motherboard test device. [0003] 2. General Background [0004] IEEE (Institute of Electrical and Electronic Engineers)1394 has two standard ports: an IEEE1394a port and an IEEE1394b port. The IEEE1394a port may provide 100 Mbps, 200 Mbps, and 400 Mbps data transmission rates. The IEEE1394b port extends data transmission rates of the IEEE1394a port, providing an 800 Mbps data transmission rate. [0005] Motherboards must be tested for quality before shipment. Conventionally, in testing, a peripheral device is coupled to a motherboard test device under test via an IEEE1394a / b port to test whether the IEEE1394a / b function works well or not. For example, an ATA / ATAPI hard disk drive is coupled to the motherboard test device via an IEEE1394a / b port to test the IEEE1394 a / b port function. However, a c...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): G01R31/28G06F3/06G06F13/38
CPCG06F11/221
Inventor YI, CHIA-CHINGWEN, TSAI-SHENGFAN, CHAO-TSUNGWANG, KUAN-NENGOU YANG, MING-SHIUCHEN, WEI-YUAN
Owner HON HAI PRECISION IND CO LTD
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