Graphene channel silicon carbide power semiconductor transistor
a silicon carbide and semiconductor technology, applied in the direction of semiconductor devices, basic electric elements, electrical equipment, etc., can solve the problems of large off-state leakage current, low breakdown voltage, low reliability, etc., and achieve the effect of reducing the overall off-state leakage current, enhancing the function of assisting depletion, and improving breakdown voltag
Patent Information
- Authority / Receiving Office
- US · United States
- Patent Type
- Applications(United States)
- Current Assignee / Owner
- Publication Date
- 2021-10-28
Smart Images

Figure 1 
Figure 2 
Figure 3
Abstract
Description
BACKGROUND OF THE INVENTION1. Technical Field
[0001] The present invention belongs to the field of high-voltage power semiconductor devices, and more particularly, to a graphene channel silicon carbide power semiconductor device.2. Background Art
[0002] Graphene is a single-layer carbon polymer with a conduction band and a valence band met at a Dirac point, and is called a zero-band gap semiconductor. As a new material, the graphene has the features of extremely high carrier mobility, submicron-scale ballistic transmission characteristic at room temperature, quantum Hall effect, excellent mechanical property, electron spin transport, superconductivity, etc., and is known as the most ideal electrode and semiconductor material, thus enabling the graphene to have a very broad development prospect in the direction of nano-electronics and spintronics components. At present, the graphene material industry has basically taken shape and is mainly used in the fields such as photoelectric semicon...
Examples
example 1
[0034]A graphene channel silicon carbide power semiconductor transistor comprises an N-type substrate 1, wherein one side of the N-type substrate 1 is provided with a drain metal 10, and the other side is an N-type drift region 2, a pair of P-type body regions 3 are arranged at two ends of the N-type drift region 2, a P+-type body contact region 4 and an N+-type source region 5 are respectively arranged in each of the P-type body regions 3, a gate oxide layer 7 is arranged on a surface of the N-type drift region 2, and two ends of the gate oxide layer 7 are respectively extended into the P-type body regions 3 at the two sides, a polysilicon gate 8 is arranged on a surface of the gate oxide layer 7, a passivation layer 6 is arranged on the polysilicon gate 8, and the passivation layer 6 wraps two sides of the polysilicon gate 8, and a source metal 9 is arranged on the N+-type source region 5 and the P+-type body contact region 4.
[0035]In the present embodiment: graphene embedded in t...
example 2
[0036]In the present embodiment, based on a traditional device structure, graphene embedded in the P-body region 3 is extended from an intersection of the N+-type source region 5 and the P-body region 3 to the N-type drift region 5 at intervals in a gate length direction, and a graphene block 12 has a length of 0.1 μm, an interval of 0.1 μm, and a thickness of 1 nm; and a graphene strip 11 is distributed continuously or at intervals in a gate width direction.
[0037]Compared with the device in the Example 2 with graphene distributed continuously or at intervals, the device in the first embodiment in cellular distribution with graphenes interconnected in the gate width direction has a lower on-resistance and a stronger current transmission capability. The cellular graphene makes a gap between the P-type body regions more obvious, an assisting depletion effect stronger, an off-state leakage current smaller, and a breakdown voltage higher. Therefore, the graphene channel silicon carbide ...