Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Single-light beam electronic speckle interference two-dimensional detecting method of symmetrical deformation field

A technology of electronic speckle interference and symmetrical deformation, which is applied to measurement devices, optical devices, instruments, etc., to achieve the effect of simple two-dimensional detection, simple system, and simplified measurement process

Inactive Publication Date: 2008-08-13
SHANDONG NORMAL UNIV
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The present invention aims at the problem that the existing electronic speckle interferometry technology can only measure the one-dimensional deformation of the object, and provides a single-beam electronic speckle interferometry that can quickly and stably measure the symmetrical deformation field of the two-dimensional component of the symmetrical deformation field object deformation Two-dimensional detection method

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Single-light beam electronic speckle interference two-dimensional detecting method of symmetrical deformation field
  • Single-light beam electronic speckle interference two-dimensional detecting method of symmetrical deformation field
  • Single-light beam electronic speckle interference two-dimensional detecting method of symmetrical deformation field

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0021] To obtain the component values ​​of the displacement field, the method of symmetrical illumination is generally used. That is, change the sign of the incident angle in the following formula (1), realize the measurement of two phase fields, and obtain the component values ​​of the displacement field through phase separation calculation. If the object to be measured is a symmetrical deformation, the second phase map can be obtained by flipping the phase map and inverting the phase, and the displacement field components can be separated by algebraic calculation of the two phases. Examples of symmetrically deformed objects are often encountered in engineering surveys. In this embodiment, a disk with a fixed periphery and a central load is used as an example to illustrate the separation of displacement field components in the present invention.

[0022] A typical single-beam illumination electronic speckle interference system such as figure 1 As shown, it includes a laser 1...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a two-dimension test method of the single-beam electron speckle interference in the symmetry distorted field. The process: (1) it tests the symmetry distorted object by the single-beam electron speckle interference system to get the phase position field of the object distortion by the phase displacement or the carrier wave modulate and the Fourier method; (2) it gets the second phase position figure by the image invert and the inverse computation to the distorted phase position figure, then to separate the in-face and off-face phase displacement field by undoing envelope, replacing the figure, overlapping and computing the algebra to get the component value of the object two-dimension distorted field. The invention has the simple system and provides a quick and stable test method for measuring the two dimensions.

Description

technical field [0001] The invention relates to a single-beam electronic speckle interference two-dimensional detection method for a symmetrical deformation field, and belongs to the technical field of measuring two-dimensional components of object deformation by electronic speckle interferometry. technical background [0002] Electronic speckle interferometry technology can accurately measure the deformation field of objects. It has the advantages of high precision, non-contact, and low requirements for vibration isolation. It is widely used in static and dynamic measurement of objects. But the current typical electronic speckle interferometry technology can only measure the one-dimensional deformation of the object. Since the deformation of the object is three-dimensional, it is often necessary to measure the two-dimensional or three-dimensional deformation components of the object. However, in the existing research results, electronic speckle interference with single-bea...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/16
Inventor 孙平
Owner SHANDONG NORMAL UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com