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Small size circuit and method for detecting a status of an electrical fuse with low read current

一种侦测电路、熔丝的技术，应用在静态存储器、只读存储器、仪器等方向，能够解决相关电路数据加载错误、电路运作错误等问题

Active Publication Date: 2008-08-13
TAIWAN SEMICON MFG CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This other circuit may cause data loading errors in the original related circuit, resulting in circuit operation errors

Method used

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  • Small size circuit and method for detecting a status of an electrical fuse with low read current
  • Small size circuit and method for detecting a status of an electrical fuse with low read current
  • Small size circuit and method for detecting a status of an electrical fuse with low read current

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Embodiment Construction

[0020] In order to make the above-mentioned and other objects, features and advantages of the present invention more comprehensible, the preferred embodiments are listed below, together with the accompanying drawings, and are described in detail as follows:

[0021] FIG. 1 is a circuit diagram of a resistive fuse element detection circuit 10 according to an embodiment of the present invention. The resistive fuse element detection circuit 10 includes a resistive fuse element 12 having a first terminal 12a and a second terminal 12b; referring to the resistive fuse element 13 having a first terminal 13a and a Second terminal 13b: a P-channel metal oxide semiconductor (PMOS) transistor 20 with a source / drain 21, a drain / source 22 and a gate 23; a PMOS transistor 30 with a source / drain 31, a drain / source 32 and a gate 33; a first inverter 40; a second inverter 70; an N-channel metal oxide semiconductor (NMOS) transistor 74 for forming a data write The input circuit has a source / dr...

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Abstract

An electrical resistive fuse element detection circuit includes a resistive fuse element of a first resistance; a resistive reference element of a second resistance different than the first resistance; first and second inverters; and first and second active devices for coupling the fuse and reference elements to the first and second inverters. The resistive fuse element is intact if a differential voltage is generated by the first and the second inverters when a low clock signal input signal is applied to the first and the second active devices. The resistive fuse element is not intact if a single voltage is generated by one of the first and the second inverters when the low clock signal input signal is applied to the first and the second active devices.

Description

technical field [0001] The present invention is an invention in the field of semiconductor devices, especially a semiconductor fuse, in particular a small circuit for detecting the state of an electronic fuse with a small reading current. Background technique [0002] In semiconductor circuits, fuses are used for various needs. For example, circuits in memory use fuses to achieve memory redundancy. Discussions and examples of fuse programmability have been disclosed in the following patents: U.S. Pat. Circuit" and U.S. Pat. No. 5,953,279 "Fuse Selection Circuit for Memory Devices." [0003] Semiconductor fuses are generally burned by applying a large voltage (relative to the voltage of the power supply) or by laser. There needs to be a circuit between the two to detect whether the semiconductor fuse has actually been successfully burned. Resistive fuse elements are usually programmable fuses, in which a fuse element is regarded as a resistor, and when its resistance valu...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C7/00G11C7/24H01H37/76
CPCG11C17/18
Inventor 吴瑞仁
Owner TAIWAN SEMICON MFG CO LTD
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