Method for manufacturing layer structure
一种层结构、中间层的技术,应用在半导体/固态器件制造、电气元件、电路等方向,能够解决费用等问题
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[0014] A 4μm thick SiGe layer is epitaxially deposited on a 300mm silicon substrate, where the germanium concentration is increased by 0 to 20% in the layer thickness. At 40×40μm 2 The roughness of the layer showed an RMS value of 100 when AFM was performed on the area of ?? The epitaxially coated substrate is then smoothed by processing with the method described. To this end, spray with water at 40°C in the etching chamber, and then use HF gas and ozone to perform etching. After being treated twice in this cycle, the substrate was sprayed with water again and centrifuged to dry. In this case, a total of 0.2 μm was removed from the SiGe layer. With 40×40μm 2 The AFM measurement performed in the area indicated that the RMS roughness was improved to 3 Ȧ.
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