Al technical title is built by PatSnap Al team. It summarizes the technical point description of the patent document.
A laser parameter and laser technology, applied in the direction of measuring device, optical device, optical radiation measurement, etc., can solve the problem of inability to measure far-field laser
Inactive Publication Date: 2008-01-09
中国人民解放军总参谋部第五十四研究所
View PDF0 Cites 28 Cited by
Summary
Abstract
Description
Claims
Application Information
AI Technical Summary
This helps you quickly interpret patents by identifying the three key elements:
Problems solved by technology
Method used
Benefits of technology
Problems solved by technology
In the prior art, the measurement methods for pulsed laser parameters mainly include ablation method, scanning method, array detection method, imaging method, etc. These methods can only measure the spot radius and energy distribution of the near-field laser when the spot radius is smal
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more
Image
Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
Click on the blue label to locate the original text in one second.
Reading with bidirectional positioning of images and text.
Smart Image
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0029] The laser parameter measurement system provided by the present invention adopts a reference laser source assisted diffuse imaging method to realize real-time measurement of laser spot parameters in the far field and when the spot diameter is large.
[0030] As shown in Figure 1, it is a schematic structural diagram of an embodiment of the laser parameter measurement system of the present invention, which includes a measured laser source 1, a reference laser source 2, a continuous laser set on the reference laser source 2 emitted and a measured laser source 1 emitted The diffuse reflection imaging target 3 in the optical path of the measured laser, the image acquisition device 4 arranged in the diffuse reflection optical path of the measured laser and the continuous laser, the image acquisition device 5 arranged in the output optical path of the image acquisition device 4, and A control processing device 6 connected to the image acquisition device 5 , and a display device...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more
PUM
Login to view more
Abstract
The invention relates to a laser measuring parameter device, including: the measured laser source, the reference laser source of the continuum laser which is used in launch as a reference standard, the diffuse reflectance imaging butt which is used diffusing the measured laser and the continuum laser, the image acquire device of the video frequency of the diffuse reflectance laser which is used in receiving the laser and the continuum laser, the image collection device of the gray image of the diffuse reflectance laser based on the video frequency signal of the laser and the diffuse reflectance laser, the laser spot diameter which storage continuous laser diffuse reflectance laser in the measured location, based on the gray image ratio of the laser and the diffuse reflectance laser and the laser spot diameter of the diffuse reflectance laser, get the control device of the laser spot diameter in the measured location, and laser display device which display the measured parameters. Using the invention, can be achieved the whole real-time measurement of the diameter spot beam parameters with the far field and the larger spot diameter.
Description
technical field [0001] The invention relates to the technical field of laser parameter measurement, in particular to a laser parameter measurement device. Background technique [0002] Due to the characteristics of good monochromaticity, high brightness, high density, strong radiation directionality and small divergence angle, laser has been widely used in scientific research, industry, national defense, medical treatment and other fields. In various applications, the parameters of the laser, such as: power, energy, mode, spot diameter, divergence angle, spot drift, power density change with time and space, divergence angle, pulse width (ie: pulse width) etc., there are strict requirements, which requires the measurement of laser parameters in advance. In the prior art, the measurement methods for pulsed laser parameters mainly include ablation method, scanning method, array detection method, imaging method, etc. These methods can only measure the spot radius and energy dis...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more
Application Information
Patent Timeline
Application Date:The date an application was filed.
Publication Date:The date a patent or application was officially published.
First Publication Date:The earliest publication date of a patent with the same application number.
Issue Date:Publication date of the patent grant document.
PCT Entry Date:The Entry date of PCT National Phase.
Estimated Expiry Date:The statutory expiry date of a patent right according to the Patent Law, and it is the longest term of protection that the patent right can achieve without the termination of the patent right due to other reasons(Term extension factor has been taken into account ).
Invalid Date:Actual expiry date is based on effective date or publication date of legal transaction data of invalid patent.
Login to view more 
Login to view more